LHD Reflectmetry #100057.1

TANAKA, Kenji, TOKUZAWA, Tokihiko, KAWAHATA, Kazuo, NAGAYAMA, Yoshio, INAGAKI, Shigeru
2025 · doi:10.57451/lhd.reflectmetry.100057.1 · W6917048729
dataset OA: green CC0
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Abstract

Microwave reflectometry is a radar technique for density profile and fluctuation measurements by using the cut-off phenomenon in a plasma.

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last seen: 2026-05-10T10:30:32.924916+00:00
License: CC0 · commercial use OK