Measuring Cell for Contrast Radiography Using Organo-inorganic Perovskite Crystals With Decaying Charge Carrier Emission

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S. Doroshkevich, Zh. V. Mezentseva, L. M. Ledo-Pereda, V. A. Kinev, and 10 more This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-5608816/v1 This work is licensed under a CC BY 4.0 License Status: Published Journal Publication published 24 Mar, 2025 Read the published version in BioNanoScience → Version 1 posted 14 You are reading this latest preprint version Abstract Medical applications require materials with a high X-ray capture cross-section to reduce the radiation dose to the human body. Hybrid organo-inorganic perovskites are promising materials for such systems due to the presence of lead ions in their composition. The electrical properties of CH 3 NH 3 PbBr 3 single crystals synthesized by the method of modified crystallization with inverse temperature dependence are studied. The conducted studies of the electrical properties allowed us to establish the applicability of the obtained crystals for medical applications and to propose a possible technical solution for the corresponding measuring cell. perovskite X-ray detector photoresistor photocurrent photogeneration quantum yield Figures Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 Figure 10 INTRODUCTION Medical applications require X-ray sensor materials with a high X-ray capture cross-section to reduce the dose load on the human body. Thus, the use of modern photoabsorbers based on organo-inorganic perovskites containing lead ions in their composition allows achieving high sensitivity of X-ray detectors, which will significantly reduce the dose load on the human body. Exceptional optoelectronic properties of organo-inorganic hybrid lead-halide photovoltaic perovskite materials (e.g., CH 3 NH 3 PbX 3 , X = Cl, Br, I) have attracted much attention from the world scientific community in terms of solar energy [1-6]. These materials have a wide spectral absorption, low exciton binding energy, high carrier mobility and significant diffusion length [7-11]. Due to this unique combination of functional properties, organic-inorganic hybrid lead-halide perovskite solar cells (PHC) with a certified power conversion efficiency of 22.1% have quickly found themselves at the forefront of photovoltaic technologies [12]. The possibility of using such materials in X-ray radiographic systems for medical purposes seems extremely interesting. In the Film Technology Laboratory of the Dubna State University (Dubna, Moscow Region), single-crystal samples hybrid organic-inorganic perovskites (HONP) were obtained, which are intended for use as X-ray detectors. The aim of this work was to study the dynamics of changes in the electrical parameters of such systems under the influence of X-ray radiation and to assess the potential use of the obtained crystals in medical applications. EXPERIMENTAL METHODOLOGY 2.1. SAMPLE SYNTHESIS Synthesis of CH 3 NH 3 PbBr 3 crystals was performed similarly to the synthesis of CsPbBr 3 by the method of modified crystallization with inverse temperature dependence. Solid salts of CH 3 NH 3 Br (1.12 g) and PbBr 2 (3.67 g) were dissolved in 10 ml of dimethyl sulfoxide. The precursors were dissolved for 1 hour at a temperature of 50 °C. After complete dissolution of the precursors, the solution was filtered and slowly heated. For this perovskite composition, the solution was heated to 80 °C at a rate of 0.4 °C/min. After 24 hours of heating at 80 °C, crystals of about 1 mm in size were obtained, which were subsequently used as seeds to obtain larger crystals (Figure 1). Subsequent crystal growth is performed similarly to the first stage, the only difference being that previously synthesized seed crystals are placed in a freshly prepared precursor solution. Then the solution is also slowly heated and kept for 24 hours at 80 °C. The cells based on perovskite crystals were assembled on a square substrate made of glass with an ITO coating measuring 10 x 10 mm. The central part of the ITO was removed from the substrate using a MiniMarker 2 laser engraver. The substrates were pre-cleaned in a Sapphire ultrasonic bath for 20 minutes successively in a soap solution, water and isopropanol. Then the crystals were fixed in the middle of the substrate using a transparent photopolymer resin Elegoo , contacts from the crystal to the conductive part of the ITO were formed using conductive silver-based glue SAF-777YQ. Digital photographs of the functional cells are shown in Figure 1. 2.2. X-RAY RADIATION A BSV-2 X-ray tube with a molybdenum anode (photon energy - 20 keV) as part of the URS-1.0 X-ray apparatus was used as a radiation source. To change the radiation intensity, the anode current of the X-ray lamp was changed within the range of 2 to 6 mA. The radiation intensity varied within the range of 1.5 - 4.5 10 14 particles / s [13]. The electrical properties of the structures on direct current (I-V characteristics) were studied under different irradiation modes (intensity of flow and time of exposure to X-rays). Two modes were used to record the I-V characteristics: direct current and pulsed. The R-45x device was used to measure the current-voltage characteristics in the constant-current mode in the voltage range up to 12 V. Electrical properties were measured in situ in real time. X-ray exposures were carried out with a period of 5 min, the measurement time in the constant-current mode in each cycle was 70 s. To measure the I-V characteristics in the pulse mode (voltage range up to 50 V), a measuring circuit in the form of a voltage divider (Figure 2) was used, consisting of the R sample sample and a series-connected resistor R divider with a nominal value of 15 MΩ. On R divider , the voltage U divider was measured with a high-resistance (input resistance 200 MΩ, MASTECH MS8250D Digital Multimeter) voltmeter. The current in the I sample circuit, which is also the current through the sample, was determined using the formula I sample = U divider / R divider . The measurement time was 5 s. For each point, the current was first measured in the dark mode, and then in the X-ray exposure mode. The resistance of the samples was determined by the formula: R sample = (U input – U divider ) / I curquit ; I = U U divider / R U divider X-ray diffraction analysis (XRD) was performed on a PANalytica Empyrean X-ray diffractometer in the angle range 2θ = 5.00° - 80.00 with a step of 0.026° using CuK a (l = 1.5418 Å) radiation. Electron microscopic images of the crystal surface were obtained on a Hitachi S-3400N scanning electron microscope (SEM) at x500 and x2000 magnifications. RESULTS 3.1. DESCRIPTION OF THE STRUCTURE AND MICROSTRUCTURE OF CRYSTALS. According to the XRD data (Figure 3), the obtained crystals of CH 3 NH 3 PbBr 3 have a cubic structure Pm3m. The calculated parameters of the crystal lattice a = b = c = 5.926 ± 0.025 Å are in good agreement with the literature data [14]. The surface topology of the studied CH 3 NH 3 PbBr 3 crystals is shown in Figure 4. The outcrops of atomic planes on the surface indicate monocrystallinity, and their large number indicates a significant defectiveness of the obtained crystals. 3.2. MEASUREMENT OF ELECTRICAL PROPERTIES IN DC MODE The calculated sample resistance was Rsample = 30 V – 1 V / (1 V / 15 MΩ) = 445 MΩ. Figure 5 depicts VAC of the tested samples obtained in direct current mode using a potentiostat. According to the graphs, in the DC mode a total exposure to X-rays (5 cycles of 70 seconds) leads to a decrease of the dark current's value through the sample by 17% (from 1.7 · 10 -7 to 1.4 · 10 -8 , Figure 5-6). The tendency for the sample response signal to decrease to X-ray radiation persisted until the last processing cycle (Figure 9e), where the signal during exposure already exceeded the dark current. That is, after the fifth irradiation cycle, an inversion in amplitude occurred for the intensity curve before and after irradiation. In addition, a spontaneous decrease in the dark current is observed when voltages above 6 V are applied to the sample (Figure 8, curve 1, black curve). These results indicate a rapid degradation of the sample structure under the action of both X-ray radiation and a constant electric field. Based on Figure 9a-e, it can be assumed that the mechanisms of degradation of the sample structure in electric and radiation fields are different, but both lead to depletion of the sample in charge carriers. 3.3. MEASUREMENTS OF THE I-V CHARACTERISTICS IN THE “PULSE” MODE (SHORT-TERM EXPOSURE MODE) The results of measuring the current in the circuit depending on the applied voltage in the dark mode and the short-term (5s) X-ray exposure mode are shown in Figure 7. A relatively linear dependence of the current on the voltage is observed both for the dark mode and for the mode with X-ray exposure up to 50 V (Figure 7a). Turning on the X-rays for 5 s led to an increase in the current in the crystal by an amount of I divider = 20-40 mV / 15 MΩ relative to the current value (Figure 7b). It is evident (Figure 7b) that the current increment monotonically increases as the voltage on the sample electrodes increases. It should be noted that there is a constant current drift in the circuit with the crystal at a voltage of 30 V and higher (Figure 8), probably similar to what was observed during measurements in the constant-current mode (Figure 6a). At longer exposures at voltages above 6 V (the mode is similar to the constant current mode, but it is implemented using equipment for research in the “pulse” mode). Within 6-7 min, both with and without X-ray exposure, the current decreases by more than ΔI divider = 100 mV / 15 MΩ, and then stabilizes on a plateau (Figure 8). The section of the curve where the relaxation of the radiation-induced signal to the initial value occurs is highlighted by the red rectangle. It can be seen that the characteristic relaxation time in the case of radiation exposure is 100 s. The curves obtained both with and without radiation exposure (Figure 5, Figure 6) contain instabilities and switching effects (current jumps). Probably, several competing relaxation processes occur continuously in the sample under the influence of the electric field, caused by structural rearrangements in the applied force fields. Bearing in mind the high electrical resistance (445 MΩ), it can be assumed that the appearance of a current pulse during X-ray irradiation is due to recharging of the electrodes as a result of radiation-induced emission of charge carriers from localized electron levels. The presence of such levels is indicated by the splitting of the strongest lines in the diffraction pattern (Figure 3). That attests to a distortion of the crystal lattice by impurity ions. Figure 9a displays the difference curve obtained by subtracting the current values in the circuit, during a short-term switching on the X-ray radiation, and the dark current measured immediately before the X-ray radiation (Figure 9b). In fact, this curve is a set of current amplitude values in the circuit (pulse peak) related to the initial current value (the moment of switching on radiation) of the circuit. According to Figure 9, the current amplitude's values in the circuit vary depending on the anode current of the X-ray lamp, i.e. on the intensity of the X-ray radiation. It can be seen that changing the intensity of the X-ray quanta flux from 1.5 to 4.5 10 14 particles/s leads to a change in the current in the measuring circuit from 6 to 9 nA. That is, the crystal in pulse mode of operation according to the magnitude of the amplitude signal allows recording objects with different X-ray density and, consequently, obtaining contrast images required for medical applications. 3.4 POSSIBLE DIAGRAM OF THE CIRCUIT'S ELECTRONICS (PROPOSED ELECTRICAL CIRCUIT DIAGRAM) The charge generated as a result of radiation-induced processes in the crystal can be used to detect X-ray radiation. Turning on a separation capacitor C separator (Figure 10) consistently with the detector in the circuit will allow you to separate the alternating component of the signal from the direct current. The voltage U out across the capacitor C integrator of the integrating circuit R integrator - C integrator , provided that the signal from the detector is unipolar, will be proportional to the charge induced on the plates of the capacitor C separator . The circuit has a maximum accumulation time of τ = 100 seconds for integrating charge according to (Figure 8) is , therefore τ ≡ τ integrator is the time constant of the integrating circuit R integrator - С integrator . Based on this condition, the element values of the specified integration scheme can be calculated. Since the number of charge carriers injected by the crystal is proportional to the dose absorbed by it, the use of the accumulated charge integral value (proportional to the capacitor voltage of С integrator ) makes it possible to quantitatively estimate the absorbed dose or capability of the material under study to absorb X-ray photons (density, thickness, ion trapping cross-sections of the material located in the X-ray path, etc.). The energy released as a result of exposure to X-rays for 100 seconds at R sample = 445 MΩ under the condition of linear signal attenuation (Figure 11) is the value W emitt = <I˃ 2 ·R Sample · t. According to Figure 8: <I˃= (5.3 – 4.8) · 10 -8 А / 2 = 2.5 · 10 -8 А W emitt = (2.5 · 10 -8 А) 2 · 4.5 · 10 8 Ω ·100 s ≈ 2.8 10 -5 J ≈ 0.3μJ Let us take capacity C integrator sufficient to accumulate all the energy released during the act of exposing the crystal to X-rays: C integrator = 2 W emitt / U input 2 C integrator = 2 · 0.3 10 -6 J / (30 · 10 -3 V) 2 = 6 · 10 -5 / 9 · 10 -4 = 7 · 10 -4 F This is quite a large capacity is due to the long exposure of the crystal. In the case of medical applications, the exposure time should be short. If we limit the exposure time to 1 ms, then the W emitt ' = 3 · 10 -10 J and the C integrator ' = 7 ·10 -9 F = 7 pF. The capacitance of C Separator must be at least one order of magnitude larger than C integrator so that its reactance does not significantly affect the operation of the integrating circuit (no capacitive divider is formed C integrator - C separator ). The nominal value of the resistor R integrator can be calculated from the time constant of the integrating circuit: R integrator ‘ · C integrator ‘ = τ integrator ‘ = 1мс R integrator ’ = 10 -3 с / C integrator · R integrator = 10 -3 с / 7 ·10 -9 F = 0.14 · 10 6 Ω = 140 · 10 3 Ω = 140 KΩ. CONCLUSIONS CH 3 NH 3 PbBr 3 crystals synthesized by modified crystallization method with inverse temperature dependent are shown to exhibit a nonlinear response to X-ray radiation. In particular, a pulsed emission of charge carriers occurs when the process saturates up to 120 seconds. This is many times greater than the time required for contrast X-ray studies of biological tissues (µs units). The physical state of the detector at such times can be considered quasi-equilibrium, i.e., despite the instability at times of the order of minutes, the resulting crystals can be used to operate under conditions of microsecond and millisecond X-ray pulses. The system's response dependence on the X-ray irradiation intensity was established. And this dependence seems extreme. The magnitude of charge emission is at a maximum when the X-ray intensity is 3 10 14 photons/s. The amount of charge emission changes 3 times (from 3 to 6 nA) with approximately double increase of the photon flux: from 1.5 to 3 10 14 photons / s. It was concluded that the obtained crystals' matrix would allow contrast analysis of biological objects (spatially sensitive detector). That is possible because of the emission charge's proportional dependence, caused by X-rays, on the intensity of X-ray fluxes (in the range of 1.5–3 10 14 photons / s, Fig. 9 ) and also, provided that a separating capacitor C separator (Fig. 10 ) and a charge integrator (R integrator -C integrator ) are used in electrical circuits that ensure charge removal from a crystal (integrating measuring cell). It is shown that the use of a charge integrator (R integrator -C integrator ) in the measuring circuit allows for a quantitative analysis of X-ray fluxes due to the dependence of the voltage on the capacitor C integrator on the number of charge carriers produced by the crystal, which can be used in the future in the development of X-ray devices for contrast studies of biological tissues. Declarations Author Contributions The manuscript was written through contributions of all authors. All authors have given approval to the final version of the manuscript. All authors contributed equally. Acknowledgment: V.A.K., T.Yu.Z., A.E.A. and A.R.T. acknowledge the financial support from the Russian Science Foundation (Project No. 23-19-00884). The investigation was performed in the scope of the Serbia-JINR cooperation Projects № 50 2024 items 7 and 8, Serbia; Serbia-JINR cooperation Projects № 51 2024 items 4 and 5, Belarus-JINR cooperation Projects № 130 2024 items 7 and 8; №289 items 16, 17 and 18. The authors express their gratitude to Prof. R.G. Nazmitdinov and Prof. V.S. Ryhvitsky (JINR, Dubna, RF) for help in planning the experiments and discussing the results. Conflict of Interest: The authors declare that they have no conflict of interest. Funding Declaration: The authors did not receive support from any organization for the submitted work. Ethics declaration: The authors declare that there are no conflicts of interest regarding this research. This study did not involve human participants or animals, and therefore, no ethical considerations are applicable. References Kojima, A., Teshima, K., Shirai, Y., & Miyasaka, T. (2009). Organometal halide perovskites as visible-light sensitizers for photovoltaic cells. 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Synthesis of Single Crystal Perovskite MAPbBr 3 by Using Anti-solvent Vapor-assisted Crystallization Method for X-Ray Photodetector Application //Journal of Physics: Conference Series. – IOP Publishing, – V. 2344. – №. 1. – P. 012002. http://doi.org/10.1088/1742-6596/2344/1/012002 Additional Declarations No competing interests reported. Cite Share Download PDF Status: Published Journal Publication published 24 Mar, 2025 Read the published version in BioNanoScience → Version 1 posted Editorial decision: Revision requested 20 Jan, 2025 Reviews received at journal 17 Jan, 2025 Reviewers agreed at journal 16 Jan, 2025 Reviewers agreed at journal 14 Jan, 2025 Reviewers agreed at journal 14 Jan, 2025 Reviewers agreed at journal 14 Jan, 2025 Reviews received at journal 30 Dec, 2024 Reviewers agreed at journal 21 Dec, 2024 Reviewers agreed at journal 19 Dec, 2024 Reviewers agreed at journal 19 Dec, 2024 Reviewers invited by journal 19 Dec, 2024 Editor assigned by journal 19 Dec, 2024 Submission checks completed at journal 18 Dec, 2024 First submitted to journal 09 Dec, 2024 You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. 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Oksengendler","email":"","orcid":"","institution":"Institute of Materials Science","correspondingAuthor":false,"prefix":"","firstName":"B.","middleName":"L.","lastName":"Oksengendler","suffix":""},{"id":395999897,"identity":"0f2cd69f-09d6-4a2b-92d2-931be7d8848d","order_by":11,"name":"A. K. Kirillov","email":"","orcid":"","institution":"Joint Institute for Nuclear Research","correspondingAuthor":false,"prefix":"","firstName":"A.","middleName":"K.","lastName":"Kirillov","suffix":""},{"id":395999898,"identity":"2b837faa-cc82-4b06-81d1-bf5b2a74560a","order_by":12,"name":"A. E. Aleksandrov","email":"","orcid":"","institution":"Frumkin Institute of Physical Chemistry and Electrochemistry","correspondingAuthor":false,"prefix":"","firstName":"A.","middleName":"E.","lastName":"Aleksandrov","suffix":""},{"id":395999899,"identity":"4b460c04-4bdc-44ea-b641-a23ea9269f87","order_by":13,"name":"A. R. Tameev","email":"","orcid":"","institution":"Frumkin Institute of Physical Chemistry and Electrochemistry","correspondingAuthor":false,"prefix":"","firstName":"A.","middleName":"R.","lastName":"Tameev","suffix":""}],"badges":[],"createdAt":"2024-12-09 12:08:16","currentVersionCode":1,"declarations":"","doi":"10.21203/rs.3.rs-5608816/v1","doiUrl":"https://doi.org/10.21203/rs.3.rs-5608816/v1","draftVersion":[],"editorialEvents":[{"content":"https://doi.org/10.1007/s12668-025-01892-9","type":"published","date":"2025-03-24T15:57:05+00:00"}],"editorialNote":"","failedWorkflow":false,"files":[{"id":73444151,"identity":"8e444363-68df-45d0-81ca-631a8afe713c","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":1,"title":"Figure 1","display":"","copyAsset":false,"role":"figure","size":943521,"visible":true,"origin":"","legend":"\u003cp\u003eSamples based on CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbBr\u003csub\u003e3\u003c/sub\u003e crystals.\u003c/p\u003e","description":"","filename":"image1.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/77fc991d4d3fb9c114065869.png"},{"id":73444152,"identity":"8c4bfde2-2b30-450a-8486-f3ed6bc26cb6","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":2,"title":"Figure 2","display":"","copyAsset":false,"role":"figure","size":20296,"visible":true,"origin":"","legend":"\u003cp\u003eElectrical diagram of the measuring circuit of the current-voltage characteristic at a voltage greater than 12V.\u003c/p\u003e","description":"","filename":"image2.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/38140537395e118d1a1b81be.png"},{"id":73444153,"identity":"0ba3f94d-b863-4f80-890a-39415261b521","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":3,"title":"Figure 3","display":"","copyAsset":false,"role":"figure","size":107809,"visible":true,"origin":"","legend":"\u003cp\u003eXRD spectrum of the studied CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbBr\u003csub\u003e3\u003c/sub\u003e crystals.\u003c/p\u003e","description":"","filename":"image3.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/af56004fb2700e7c3e785cbd.png"},{"id":73444157,"identity":"9c61d687-dc6a-499e-880d-cada032ab470","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":4,"title":"Figure 4","display":"","copyAsset":false,"role":"figure","size":667346,"visible":true,"origin":"","legend":"\u003cp\u003eSurface topology of the obtained single crystals according to SEM data (a, magnification x500) and crystallite morphology (b, magnification x2000).\u003c/p\u003e","description":"","filename":"image4.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/719a398f05f9d289747b4337.png"},{"id":73444165,"identity":"8f6aa87d-a198-409f-9b19-e1a2dbc41f03","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":5,"title":"Figure 5","display":"","copyAsset":false,"role":"figure","size":282904,"visible":true,"origin":"","legend":"\u003cp\u003eVAC curves of samples obtained in a periodic X-ray irradiation mode (5 cycles of 70 seconds).\u003c/p\u003e","description":"","filename":"image5.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/24d696737abb96266a24eb89.png"},{"id":73444156,"identity":"28bda4f3-7c02-4ff3-8c09-b78e54e91d5a","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":6,"title":"Figure 6","display":"","copyAsset":false,"role":"figure","size":55741,"visible":true,"origin":"","legend":"\u003cp\u003eI-V characteristics of sample 4: dark current and current in irradiation mode, cycle 1 (a), cycle 2 (b), cycle 3 (c), cycle 4 (d), cycle 5 (e).\u003c/p\u003e","description":"","filename":"image6.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/13a567f30f110d9ab611c072.png"},{"id":73444159,"identity":"11b08a66-2fac-45ea-8bd7-8e04d4b73848","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":7,"title":"Figure 7","display":"","copyAsset":false,"role":"figure","size":34007,"visible":true,"origin":"","legend":"\u003cp\u003e\u003cstrong\u003ea \u003c/strong\u003e- VAC of the sample in the voltage range up to 50 V without irradiation (curve 1, black curve) and under X-ray irradiation (curve 2, red curve); \u003cstrong\u003eb\u003c/strong\u003e - signal difference between the dark current and the current in the irradiation mode.\u003c/p\u003e","description":"","filename":"image7.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/ae8b1e2a77947f93c091d319.png"},{"id":73444722,"identity":"41ef387f-3ab9-470d-8bce-288ce376e721","added_by":"auto","created_at":"2025-01-10 04:40:32","extension":"png","order_by":8,"title":"Figure 8","display":"","copyAsset":false,"role":"figure","size":189199,"visible":true,"origin":"","legend":"\u003cp\u003eTime dependence of the sample's current without irradiation (black curve) and under irradiation (red curve).\u003c/p\u003e","description":"","filename":"image8.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/055059ccab0d6e48648e802f.png"},{"id":73444177,"identity":"08c6b069-1255-4aa0-a204-e54ed56bd19b","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":9,"title":"Figure 9","display":"","copyAsset":false,"role":"figure","size":50653,"visible":true,"origin":"","legend":"\u003cp\u003e\u003cstrong\u003ea\u003c/strong\u003e - difference curve obtained by subtracting the values ​​of the current in the measuring circuit, established during the short-term switching on of the X-ray radiation, and the dark current measured immediately before switching on the X-ray radiation; \u003cstrong\u003eb\u003c/strong\u003e - dependence of the current in the crystal on the intensity of X-ray radiation under conditions of no irradiation (curve 1, red curve) and under irradiation conditions (curve 2, black curve).\u003c/p\u003e","description":"","filename":"image9.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/22b40e0df5063c644a6f2fc4.png"},{"id":73444163,"identity":"9f077df8-9774-47ee-9df0-67a7e9fd9bc7","added_by":"auto","created_at":"2025-01-10 04:32:32","extension":"png","order_by":10,"title":"Figure 10","display":"","copyAsset":false,"role":"figure","size":17750,"visible":true,"origin":"","legend":"\u003cp\u003eScheme of a measuring cell with a decoupling capacitor for perovskite crystal signal capture.\u003c/p\u003e","description":"","filename":"image10.png","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/23d2125b65717b4b9d97f5a0.png"},{"id":79604795,"identity":"9c36c946-4344-4973-baa2-ac535737ff48","added_by":"auto","created_at":"2025-03-31 16:05:52","extension":"pdf","order_by":0,"title":"","display":"","copyAsset":false,"role":"manuscript-pdf","size":2699104,"visible":true,"origin":"","legend":"","description":"","filename":"manuscript.pdf","url":"https://assets-eu.researchsquare.com/files/rs-5608816/v1/65ae0b23-6f68-4224-93ac-3d1f02e0e0d4.pdf"}],"financialInterests":"No competing interests reported.","formattedTitle":"\u003cp\u003eMeasuring Cell for Contrast Radiography Using Organo-inorganic Perovskite Crystals With Decaying Charge Carrier Emission\u003c/p\u003e","fulltext":[{"header":"INTRODUCTION","content":"\u003cp\u003eMedical applications require X-ray sensor materials with a high X-ray capture cross-section to reduce the dose load on the human body. Thus, the use of modern photoabsorbers based on organo-inorganic perovskites containing lead ions in their composition allows achieving high sensitivity of X-ray detectors, which will significantly reduce the dose load on the human body.\u003c/p\u003e\n\u003cp\u003eExceptional optoelectronic properties of organo-inorganic hybrid lead-halide photovoltaic perovskite materials (e.g., CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbX\u003csub\u003e3\u003c/sub\u003e, X = Cl, Br, I) have attracted much attention from the world scientific community in terms of solar energy [1-6]. These materials have a wide spectral absorption, low exciton binding energy, high carrier mobility and significant diffusion length [7-11]. Due to this unique combination of functional properties, organic-inorganic hybrid lead-halide perovskite solar cells (PHC) with a certified power conversion efficiency of 22.1% have quickly found themselves at the forefront of photovoltaic technologies [12]. The possibility of using such materials in X-ray radiographic systems for medical purposes seems extremely interesting.\u003c/p\u003e\n\u003cp\u003eIn the Film Technology Laboratory of the Dubna State University (Dubna, Moscow Region), single-crystal samples hybrid organic-inorganic perovskites (HONP) were obtained, which are intended for use as X-ray detectors.\u003c/p\u003e\n\u003cp\u003eThe aim of this work was to study the dynamics of changes in the electrical parameters of such systems under the influence of X-ray radiation and to assess the potential use of the obtained crystals in medical applications.\u003c/p\u003e"},{"header":"EXPERIMENTAL METHODOLOGY","content":"\u003cp\u003e2.1. SAMPLE SYNTHESIS\u0026nbsp;\u003c/p\u003e\n\u003cp\u003eSynthesis of CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbBr\u003csub\u003e3\u003c/sub\u003e crystals was performed similarly to the synthesis of CsPbBr\u003csub\u003e3\u003c/sub\u003e by the method of modified crystallization with inverse temperature dependence.\u0026nbsp;\u003c/p\u003e\n\u003cp\u003eSolid salts of CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003eBr (1.12 g) and PbBr\u003csub\u003e2\u003c/sub\u003e (3.67 g) were dissolved in 10 ml of dimethyl sulfoxide. The precursors were dissolved for 1 hour at a temperature of 50 \u0026deg;C. After complete dissolution of the precursors, the solution was filtered and slowly heated. For this perovskite composition, the solution was heated to 80 \u0026deg;C at a rate of 0.4 \u0026deg;C/min. After 24 hours of heating at 80 \u0026deg;C, crystals of about 1 mm in size were obtained, which were subsequently used as seeds to obtain larger crystals (Figure 1). Subsequent crystal growth is performed similarly to the first stage, the only difference being that previously synthesized seed crystals are placed in a freshly prepared precursor solution. Then the solution is also slowly heated and kept for 24 hours at 80 \u0026deg;C.\u0026nbsp;\u003c/p\u003e\n\u003cp\u003eThe cells based on perovskite crystals were assembled on a square substrate made of glass with an ITO coating measuring 10 x 10 mm. The central part of the ITO was removed from the substrate using a MiniMarker 2 laser engraver. The substrates were pre-cleaned in a Sapphire ultrasonic bath for 20 minutes successively in a soap solution, water and isopropanol. Then the crystals were fixed in the middle of the substrate using a transparent photopolymer resin Elegoo , contacts from the crystal to the conductive part of the ITO were formed using conductive silver-based glue SAF-777YQ. Digital photographs of the functional cells are shown in Figure 1.\u003c/p\u003e\n\u003cp\u003e2.2. X-RAY RADIATION\u003c/p\u003e\n\u003cp\u003eA BSV-2 X-ray tube with a molybdenum anode (photon energy - 20 keV) as part of the URS-1.0 X-ray apparatus was used as a radiation source. To change the radiation intensity, the anode current of the X-ray lamp was changed within the range of 2 to 6 mA. The radiation intensity varied within the range of 1.5 - 4.5 10\u003csup\u003e14\u003c/sup\u003e particles / s [13].\u003c/p\u003e\n\u003cp\u003eThe electrical properties of the structures on direct current (I-V characteristics) were studied under different irradiation modes (intensity of flow and time of exposure to X-rays). Two modes were used to record the I-V characteristics: direct current and pulsed.\u003c/p\u003e\n\u003cp\u003eThe R-45x device was used to measure the current-voltage characteristics in the constant-current mode in the voltage range up to 12 V. Electrical properties were measured \u003cem\u003ein situ\u003c/em\u003e in real time. X-ray exposures were carried out with a period of 5 min, the measurement time in the constant-current mode in each cycle was 70 s.\u003c/p\u003e\n\u003cp\u003eTo measure the I-V characteristics in the pulse mode (voltage range up to 50 V), a measuring circuit in the form of a voltage divider (Figure 2) was used, consisting of the R\u003csub\u003esample\u003c/sub\u003e sample and a series-connected resistor R\u003csub\u003edivider\u003c/sub\u003e with a nominal value of 15 M\u0026Omega;. On R\u003csub\u003edivider\u003c/sub\u003e, the voltage U\u003csub\u003edivider\u003c/sub\u003e was measured with a high-resistance (input resistance 200 M\u0026Omega;, MASTECH MS8250D Digital Multimeter) voltmeter. The current in the I\u003csub\u003esample\u003c/sub\u003e circuit, which is also the current through the sample, was determined using the formula I\u003csub\u003esample\u003c/sub\u003e = U\u003csub\u003edivider\u003c/sub\u003e / R\u003csub\u003edivider\u003c/sub\u003e. The measurement time was 5 s. For each point, the current was first measured in the dark mode, and then in the X-ray exposure mode.\u003c/p\u003e\n\u003cp\u003eThe resistance of the samples was determined by the formula:\u003c/p\u003e\n\u003cp\u003eR\u003csub\u003esample\u003c/sub\u003e = (U\u003csub\u003einput\u003c/sub\u003e \u0026ndash; U\u003csub\u003edivider\u003c/sub\u003e) / I\u003csub\u003ecurquit\u003c/sub\u003e;\u003c/p\u003e\n\u003cp\u003eI = U U\u003csub\u003edivider\u003c/sub\u003e / R U\u003csub\u003edivider\u003c/sub\u003e\u003c/p\u003e\n\u003cp\u003eX-ray diffraction analysis (XRD) was performed on a PANalytica Empyrean X-ray diffractometer in the angle range 2\u0026theta; = 5.00\u0026deg; - 80.00 with a step of 0.026\u0026deg; using CuK\u003csub\u003ea\u003c/sub\u003e (l = 1.5418 \u0026Aring;) radiation.\u003c/p\u003e\n\u003cp\u003eElectron microscopic images of the crystal surface were obtained on a Hitachi S-3400N scanning electron microscope (SEM) at x500 and x2000 magnifications.\u003c/p\u003e"},{"header":"RESULTS","content":"\u003cp\u003e3.1. DESCRIPTION OF THE STRUCTURE AND MICROSTRUCTURE OF CRYSTALS.\u003c/p\u003e\n\u003cp\u003eAccording to the XRD data (Figure 3), the obtained crystals of CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbBr\u003csub\u003e3\u003c/sub\u003e have a cubic structure Pm3m. The calculated parameters of the crystal lattice a = b = c = 5.926 \u0026plusmn; 0.025 \u0026Aring; are in good agreement with the literature data [14].\u003c/p\u003e\n\u003cp\u003eThe surface topology of the studied CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbBr\u003csub\u003e3\u003c/sub\u003e crystals is shown in Figure 4. The outcrops of atomic planes on the surface indicate monocrystallinity, and their large number indicates a significant defectiveness of the obtained crystals.\u003c/p\u003e\n\u003cp\u003e3.2. MEASUREMENT OF ELECTRICAL PROPERTIES IN DC MODE\u003c/p\u003e\n\u003cp\u003eThe calculated sample resistance was Rsample = 30 V \u0026ndash; 1 V / (1 V / 15 M\u0026Omega;) = 445 M\u0026Omega;.\u003c/p\u003e\n\u003cp\u003eFigure 5 depicts VAC of the tested samples obtained in direct current mode using a potentiostat. According to the graphs, in the DC mode a total exposure to X-rays (5 cycles of 70 seconds) leads to a decrease of the dark current's value through the sample by 17% (from 1.7 \u0026middot; 10\u003csup\u003e-7\u003c/sup\u003e to 1.4 \u0026middot; 10\u003csup\u003e-8\u003c/sup\u003e, Figure 5-6).\u003c/p\u003e\n\u003cp\u003eThe tendency for the sample response signal to decrease to X-ray radiation persisted until the last processing cycle (Figure 9e), where the signal during exposure already exceeded the dark current. That is, after the fifth irradiation cycle, an inversion in amplitude occurred for the intensity curve before and after irradiation. In addition, a spontaneous decrease in the dark current is observed when voltages above 6 V are applied to the sample (Figure 8, curve 1, black curve). These results indicate a rapid degradation of the sample structure under the action of both X-ray radiation and a constant electric field. Based on Figure 9a-e, it can be assumed that the mechanisms of degradation of the sample structure in electric and radiation fields are different, but both lead to depletion of the sample in charge carriers.\u003c/p\u003e\n\u003cp\u003e3.3. MEASUREMENTS OF THE I-V CHARACTERISTICS IN THE \u0026ldquo;PULSE\u0026rdquo; MODE (SHORT-TERM EXPOSURE MODE)\u003c/p\u003e\n\u003cp\u003eThe results of measuring the current in the circuit depending on the applied voltage in the dark mode and the short-term (5s) X-ray exposure mode are shown in Figure 7. A relatively linear dependence of the current on the voltage is observed both for the dark mode and for the mode with X-ray exposure up to 50 V (Figure 7a). Turning on the X-rays for 5 s led to an increase in the current in the crystal by an amount of I\u003csub\u003edivider\u003c/sub\u003e = 20-40 mV / 15 M\u0026Omega; relative to the current value (Figure 7b). It is evident (Figure 7b) that the current increment monotonically increases as the voltage on the sample electrodes increases. It should be noted that there is a constant current drift in the circuit with the crystal at a voltage of 30 V and higher (Figure 8), probably similar to what was observed during measurements in the constant-current mode (Figure 6a).\u003c/p\u003e\n\u003cp\u003eAt longer exposures at voltages above 6 V (the mode is similar to the constant current mode, but it is implemented using equipment for research in the \u0026ldquo;pulse\u0026rdquo; mode). Within 6-7 min, both with and without X-ray exposure, the current decreases by more than \u0026Delta;I\u003csub\u003edivider\u003c/sub\u003e = 100 mV / 15 M\u0026Omega;, and then stabilizes on a plateau (Figure 8). The section of the curve where the relaxation of the radiation-induced signal to the initial value occurs is highlighted by the red rectangle. It can be seen that the characteristic relaxation time in the case of radiation exposure is 100 s. The curves obtained both with and without radiation exposure (Figure 5, Figure 6) contain instabilities and switching effects (current jumps). Probably, several competing relaxation processes occur continuously in the sample under the influence of the electric field, caused by structural rearrangements in the applied force fields.\u003c/p\u003e\n\u003cp\u003eBearing in mind the high electrical resistance (445 M\u0026Omega;), it can be assumed that the appearance of a current pulse during X-ray irradiation is due to recharging of the electrodes as a result of radiation-induced emission of charge carriers from localized electron levels. The presence of such levels is indicated by the splitting of the strongest lines in the diffraction pattern (Figure 3). That attests to a distortion of the crystal lattice by impurity ions.\u003c/p\u003e\n\u003cp\u003eFigure 9a displays the difference curve obtained by subtracting the current values in the circuit, during a short-term switching on the X-ray radiation, and the dark current measured immediately before the X-ray radiation (Figure 9b). In fact, this curve is a set of current amplitude values in the circuit (pulse peak) related to the initial current value (the moment of switching on radiation) of the circuit.\u003c/p\u003e\n\u003cp\u003eAccording to Figure 9, the current amplitude's values in the circuit vary depending on the anode current of the X-ray lamp, i.e. on the intensity of the X-ray radiation. It can be seen that changing the intensity of the X-ray quanta flux from 1.5 to 4.5 10\u003csup\u003e14\u003c/sup\u003e particles/s leads to a change in the current in the measuring circuit from 6 to 9 nA. That is, the crystal in pulse mode of operation according to the magnitude of the amplitude signal allows recording objects with different X-ray density and, consequently, obtaining contrast images required for medical applications.\u0026nbsp;\u003c/p\u003e\n\u003cp\u003e3.4 POSSIBLE DIAGRAM OF THE CIRCUIT'S ELECTRONICS (PROPOSED ELECTRICAL CIRCUIT DIAGRAM)\u003c/p\u003e\n\u003cp\u003eThe charge generated as a result of radiation-induced processes in the crystal can be used to detect X-ray radiation. Turning on a separation capacitor C\u003csub\u003eseparator\u003c/sub\u003e (Figure 10) consistently with the detector in the circuit will allow you to separate the alternating component of the signal from the direct current. The voltage U\u003csub\u003eout\u003c/sub\u003e across the capacitor C\u003csub\u003eintegrator\u003c/sub\u003e of the integrating circuit R\u003csub\u003eintegrator\u003c/sub\u003e - C\u003csub\u003eintegrator\u003c/sub\u003e, provided that the signal from the detector is unipolar, will be proportional to the charge induced on the plates of the capacitor C\u003csub\u003eseparator\u003c/sub\u003e. The circuit has a maximum accumulation time of \u0026tau; = 100 seconds for integrating charge according to (Figure 8) is , therefore \u0026tau; \u0026equiv; \u0026tau;\u003csub\u003eintegrator\u003c/sub\u003e is the time constant of the integrating circuit R\u003csub\u003eintegrator\u003c/sub\u003e - С\u003csub\u003eintegrator\u003c/sub\u003e. Based on this condition, the element values of the specified integration scheme can be calculated.\u003c/p\u003e\n\u003cp\u003eSince the number of charge carriers injected by the crystal is proportional to the dose absorbed by it, the use of the accumulated charge integral value (proportional to the capacitor voltage of С\u003csub\u003eintegrator\u003c/sub\u003e) makes it possible to quantitatively estimate the absorbed dose or capability of the material under study to absorb X-ray photons (density, thickness, ion trapping cross-sections of the material located in the X-ray path, etc.). The energy released as a result of exposure to X-rays for 100 seconds at R\u003csub\u003esample\u003c/sub\u003e = 445 M\u0026Omega; under the condition of linear signal attenuation (Figure 11) is the value W\u003csub\u003eemitt\u003c/sub\u003e = \u0026lt;I˃\u003csup\u003e2\u003c/sup\u003e \u0026middot;R\u003csub\u003eSample\u003c/sub\u003e \u0026middot; t.\u003c/p\u003e\n\u003cp\u003eAccording to Figure 8:\u003c/p\u003e\n\u003cp\u003e\u0026lt;I˃= (5.3 \u0026ndash; 4.8) \u0026middot; 10\u003csup\u003e-8\u003c/sup\u003e А / 2 = 2.5 \u0026middot; 10\u003csup\u003e-8\u003c/sup\u003e А\u003c/p\u003e\n\u003cp\u003eW\u003csub\u003eemitt \u003c/sub\u003e= (2.5 \u0026middot; 10\u003csup\u003e-8\u003c/sup\u003e А)\u003csup\u003e2\u003c/sup\u003e \u0026middot; 4.5 \u0026middot; 10\u003csup\u003e8 \u003c/sup\u003e\u0026Omega; \u0026middot;100 s \u0026asymp; 2.8 10\u003csup\u003e-5\u003c/sup\u003e J \u0026asymp; 0.3\u0026mu;J\u003c/p\u003e\n\u003cp\u003eLet us take capacity C\u003csub\u003eintegrator\u003c/sub\u003e sufficient to accumulate all the energy released during the act of exposing the crystal to X-rays:\u003c/p\u003e\n\u003cp\u003eC\u003csub\u003eintegrator\u003c/sub\u003e = 2 W\u003csub\u003eemitt \u003c/sub\u003e/ U\u003csub\u003einput\u003c/sub\u003e\u003csup\u003e 2\u003c/sup\u003e\u003c/p\u003e\n\u003cp\u003eC\u003csub\u003eintegrator\u003c/sub\u003e = 2 \u0026middot; 0.3 10\u003csup\u003e-6\u003c/sup\u003e J / (30 \u0026middot; 10\u003csup\u003e-3 \u003c/sup\u003eV)\u003csup\u003e2\u003c/sup\u003e = 6 \u0026middot; 10\u003csup\u003e-5\u003c/sup\u003e / 9 \u0026middot; 10\u003csup\u003e-4\u003c/sup\u003e = 7 \u0026middot; 10\u003csup\u003e-4 \u003c/sup\u003eF\u003c/p\u003e\n\u003cp\u003eThis is quite a large capacity is due to the long exposure of the crystal. In the case of medical applications, the exposure time should be short. If we limit the exposure time to 1 ms, then the W\u003csub\u003eemitt\u003c/sub\u003e ' = 3 \u0026middot; 10\u003csup\u003e-10 \u003c/sup\u003eJ and the C\u003csub\u003eintegrator\u003c/sub\u003e ' = 7 \u0026middot;10\u003csup\u003e-9\u003c/sup\u003e F = 7 pF.\u003c/p\u003e\n\u003cp\u003eThe capacitance of C\u003csub\u003eSeparator\u003c/sub\u003e must be at least one order of magnitude larger than C\u003csub\u003eintegrator\u003c/sub\u003e so that its reactance does not significantly affect the operation of the integrating circuit (no capacitive divider is formed C\u003csub\u003eintegrator\u003c/sub\u003e - C\u003csub\u003eseparator\u003c/sub\u003e).\u003c/p\u003e\n\u003cp\u003eThe nominal value of the resistor R\u003csub\u003eintegrator\u003c/sub\u003e can be calculated from the time constant of the integrating circuit:\u003c/p\u003e\n\u003cp\u003eR\u003csub\u003eintegrator\u003c/sub\u003e\u0026lsquo; \u0026middot; C\u003csub\u003eintegrator\u003c/sub\u003e\u0026lsquo; = \u0026tau;\u003csub\u003eintegrator\u003c/sub\u003e\u0026lsquo; = 1мс\u003c/p\u003e\n\u003cp\u003eR\u003csub\u003eintegrator\u003c/sub\u003e\u0026rsquo; = 10\u003csup\u003e-3\u003c/sup\u003e с / C\u003csub\u003eintegrator \u003c/sub\u003e\u0026middot; R\u003csub\u003eintegrator\u003c/sub\u003e = 10\u003csup\u003e-3 \u003c/sup\u003eс / 7 \u0026middot;10\u003csup\u003e-9 \u003c/sup\u003eF = 0.14 \u0026middot; 10\u003csup\u003e6\u003c/sup\u003e \u0026Omega; = 140 \u0026middot;\u0026nbsp;10\u003csup\u003e3\u003c/sup\u003e \u0026Omega; = 140 K\u0026Omega;.\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003e\u0026nbsp;\u003c/strong\u003e\u003c/p\u003e\n\u003ch3\u003e\u003c/h3\u003e\n"},{"header":"CONCLUSIONS","content":"\u003col\u003e\n\u003cli\u003e\n\u003cp\u003eCH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbBr\u003csub\u003e3\u003c/sub\u003e crystals synthesized by modified crystallization method with inverse temperature dependent are shown to exhibit a nonlinear response to X-ray radiation. In particular, a pulsed emission of charge carriers occurs when the process saturates up to 120 seconds. This is many times greater than the time required for contrast X-ray studies of biological tissues (\u0026micro;s units). The physical state of the detector at such times can be considered quasi-equilibrium, i.e., despite the instability at times of the order of minutes, the resulting crystals can be used to operate under conditions of microsecond and millisecond X-ray pulses.\u003c/p\u003e\n\u003c/li\u003e\n\u003cli\u003e\n\u003cp\u003eThe system's response dependence on the X-ray irradiation intensity was established. And this dependence seems extreme. The magnitude of charge emission is at a maximum when the X-ray intensity is 3 10\u003csup\u003e14\u003c/sup\u003e photons/s. The amount of charge emission changes 3 times (from 3 to 6 nA) with approximately double increase of the photon flux: from 1.5 to 3 10\u003csup\u003e14\u003c/sup\u003e photons / s.\u003c/p\u003e\n\u003c/li\u003e\n\u003cli\u003e\n\u003cp\u003eIt was concluded that the obtained crystals' matrix would allow contrast analysis of biological objects (spatially sensitive detector). That is possible because of the emission charge's proportional dependence, caused by X-rays, on the intensity of X-ray fluxes (in the range of 1.5\u0026ndash;3 10\u003csup\u003e14\u003c/sup\u003e photons / s, Fig.\u0026nbsp;\u003cspan class=\"InternalRef\"\u003e9\u003c/span\u003e) and also, provided that a separating capacitor C\u003csub\u003eseparator\u003c/sub\u003e (Fig.\u0026nbsp;\u003cspan class=\"InternalRef\"\u003e10\u003c/span\u003e) and a charge integrator (R\u003csub\u003eintegrator\u003c/sub\u003e-C\u003csub\u003eintegrator\u003c/sub\u003e) are used in electrical circuits that ensure charge removal from a crystal (integrating measuring cell).\u003c/p\u003e\n\u003c/li\u003e\n\u003cli\u003e\n\u003cp\u003eIt is shown that the use of a charge integrator (R\u003csub\u003eintegrator\u003c/sub\u003e-C\u003csub\u003eintegrator\u003c/sub\u003e) in the measuring circuit allows for a quantitative analysis of X-ray fluxes due to the dependence of the voltage on the capacitor C\u003csub\u003eintegrator\u003c/sub\u003e on the number of charge carriers produced by the crystal, which can be used in the future in the development of X-ray devices for contrast studies of biological tissues.\u003c/p\u003e\n\u003c/li\u003e\n\u003c/ol\u003e"},{"header":"Declarations","content":"\u003cp\u003eAuthor Contributions\u003c/p\u003e\n\u003cp\u003eThe manuscript was written through contributions of all authors. All authors have given approval to the final version of the manuscript. All authors contributed equally.\u0026nbsp;\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eAcknowledgment:\u0026nbsp;\u003c/strong\u003eV.A.K., T.Yu.Z., A.E.A. and A.R.T. acknowledge the financial support from the Russian Science Foundation (Project No. 23-19-00884).\u003c/p\u003e\n\u003cp\u003eThe investigation was performed in the scope of the Serbia-JINR cooperation Projects № 50 2024 items 7 and 8, Serbia; Serbia-JINR cooperation Projects № 51 2024 items 4 and 5, Belarus-JINR cooperation Projects № 130 2024 items 7 and 8; №289 items 16, 17 and 18.\u003c/p\u003e\n\u003cp\u003eThe authors express their gratitude to Prof. R.G. Nazmitdinov and Prof. V.S. Ryhvitsky (JINR, Dubna, RF) for help in planning the experiments and discussing the results.\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eConflict of Interest:\u0026nbsp;\u003c/strong\u003eThe authors declare that they have no conflict of interest.\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eFunding Declaration:\u003c/strong\u003e The authors did not receive support from any organization for the submitted work.\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eEthics declaration:\u003c/strong\u003e The authors declare that there are no conflicts of interest regarding this research. This study did not involve human participants or animals, and therefore, no ethical considerations are applicable.\u003c/p\u003e"},{"header":"References","content":"\u003col\u003e\u003cli\u003e\u003cspan\u003eKojima, A., Teshima, K., Shirai, Y., \u0026amp; Miyasaka, T. (2009). 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Synthesis of Single Crystal Perovskite MAPbBr\u003csub\u003e3\u003c/sub\u003e by Using Anti-solvent Vapor-assisted Crystallization Method for X-Ray Photodetector Application //Journal of Physics: Conference Series. \u0026ndash; IOP Publishing, \u0026ndash; V. 2344. \u0026ndash; №. 1. \u0026ndash; P. 012002. \u003cspan class=\"ExternalRef\"\u003e\u003cspan class=\"RefSource\"\u003ehttp://doi.org/10.1088/1742-6596/2344/1/012002\u003c/span\u003e\u003cspan address=\"10.1088/1742-6596/2344/1/012002\" targettype=\"DOI\" class=\"RefTarget\"\u003e\u003c/span\u003e\u003c/span\u003e\u003c/span\u003e\u003c/li\u003e\u003c/ol\u003e"}],"fulltextSource":"","fullText":"","funders":[],"hasAdminPriorityOnWorkflow":false,"hasManuscriptDocX":true,"hasOptedInToPreprint":true,"hasPassedJournalQc":"","hasAnyPriority":true,"hideJournal":false,"highlight":"","institution":"","isAcceptedByJournal":true,"isAuthorSuppliedPdf":false,"isDeskRejected":"","isHiddenFromSearch":false,"isInQc":false,"isInWorkflow":false,"isPdf":false,"isPdfUpToDate":true,"isWithdrawnOrRetracted":false,"journal":{"display":true,"email":"[email protected]","identity":"bionanoscience","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":false,"externalIdentity":"bnsc","sideBox":"Learn more about [BioNanoScience](http://link.springer.com/journal/12668)","snPcode":"12668","submissionUrl":"https://submission.nature.com/new-submission/12668/3","title":"BioNanoScience","twitterHandle":"","acdcEnabled":true,"dfaEnabled":true,"editorialSystem":"em","reportingPortfolio":"Springer Hybrid","inReviewEnabled":true,"inReviewRevisionsEnabled":false},"keywords":"perovskite, X-ray detector, photoresistor, photocurrent, photogeneration quantum yield","lastPublishedDoi":"10.21203/rs.3.rs-5608816/v1","lastPublishedDoiUrl":"https://doi.org/10.21203/rs.3.rs-5608816/v1","license":{"name":"CC BY 4.0","url":"https://creativecommons.org/licenses/by/4.0/"},"manuscriptAbstract":"\u003cp\u003eMedical applications require materials with a high X-ray capture cross-section to reduce the radiation dose to the human body. Hybrid organo-inorganic perovskites are promising materials for such systems due to the presence of lead ions in their composition. The electrical properties of CH\u003csub\u003e3\u003c/sub\u003eNH\u003csub\u003e3\u003c/sub\u003ePbBr\u003csub\u003e3\u003c/sub\u003e single crystals synthesized by the method of modified crystallization with inverse temperature dependence are studied. The conducted studies of the electrical properties allowed us to establish the applicability of the obtained crystals for medical applications and to propose a possible technical solution for the corresponding measuring cell.\u003c/p\u003e","manuscriptTitle":"Measuring Cell for Contrast Radiography Using Organo-inorganic Perovskite Crystals With Decaying Charge Carrier Emission","msid":"","msnumber":"","nonDraftVersions":[{"code":1,"date":"2025-01-10 04:32:27","doi":"10.21203/rs.3.rs-5608816/v1","editorialEvents":[{"type":"communityComments","content":0},{"type":"decision","content":"Revision requested","date":"2025-01-20T09:22:46+00:00","index":"","fulltext":""},{"type":"editorInvitedReview","content":"","date":"2025-01-18T02:05:11+00:00","index":"hide","fulltext":""},{"type":"reviewerAgreed","content":"122751506527077161290434346430168082267","date":"2025-01-16T18:24:20+00:00","index":"hide","fulltext":""},{"type":"reviewerAgreed","content":"147778618474215717461154629203692602207","date":"2025-01-15T01:08:48+00:00","index":"hide","fulltext":""},{"type":"reviewerAgreed","content":"70085860863171135749224552800889451253","date":"2025-01-14T12:25:00+00:00","index":"hide","fulltext":""},{"type":"reviewerAgreed","content":"136596518395229580487586733467699809118","date":"2025-01-14T08:59:13+00:00","index":"hide","fulltext":""},{"type":"editorInvitedReview","content":"","date":"2024-12-31T00:59:20+00:00","index":"hide","fulltext":""},{"type":"reviewerAgreed","content":"205065821086399972025380751385311553574","date":"2024-12-21T08:16:25+00:00","index":"hide","fulltext":""},{"type":"reviewerAgreed","content":"224907139196051799641160805465252877484","date":"2024-12-19T13:29:17+00:00","index":"hide","fulltext":""},{"type":"reviewerAgreed","content":"287590600471938869742934627684299362444","date":"2024-12-19T08:44:35+00:00","index":"hide","fulltext":""},{"type":"reviewersInvited","content":"","date":"2024-12-19T07:52:02+00:00","index":"","fulltext":""},{"type":"editorAssigned","content":"","date":"2024-12-19T07:47:37+00:00","index":"","fulltext":""},{"type":"checksComplete","content":"","date":"2024-12-19T00:55:40+00:00","index":"","fulltext":""},{"type":"submitted","content":"BioNanoScience","date":"2024-12-09T11:56:11+00:00","index":"","fulltext":""}],"status":"published","journal":{"display":true,"email":"[email protected]","identity":"bionanoscience","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":false,"externalIdentity":"bnsc","sideBox":"Learn more about [BioNanoScience](http://link.springer.com/journal/12668)","snPcode":"12668","submissionUrl":"https://submission.nature.com/new-submission/12668/3","title":"BioNanoScience","twitterHandle":"","acdcEnabled":true,"dfaEnabled":true,"editorialSystem":"em","reportingPortfolio":"Springer Hybrid","inReviewEnabled":true,"inReviewRevisionsEnabled":false}}],"origin":"","ownerIdentity":"ab721e26-5280-4a47-a24b-c5372694af14","owner":[],"postedDate":"January 10th, 2025","published":true,"recentEditorialEvents":[],"rejectedJournal":[],"revision":"","amendment":"","status":"published-in-journal","subjectAreas":[],"tags":[],"updatedAt":"2025-03-31T15:59:08+00:00","versionOfRecord":{"articleIdentity":"rs-5608816","link":"https://doi.org/10.1007/s12668-025-01892-9","journal":{"identity":"bionanoscience","isVorOnly":false,"title":"BioNanoScience"},"publishedOn":"2025-03-24 15:57:05","publishedOnDateReadable":"March 24th, 2025"},"versionCreatedAt":"2025-01-10 04:32:27","video":"","vorDoi":"10.1007/s12668-025-01892-9","vorDoiUrl":"https://doi.org/10.1007/s12668-025-01892-9","workflowStages":[]},"version":"v1","identity":"rs-5608816","journalConfig":"researchsquare"},"__N_SSP":true},"page":"/article/[identity]/[[...version]]","query":{"redirect":"/article/rs-5608816","identity":"rs-5608816","version":["v1"]},"buildId":"8U1c8b4HqxoKbykW_rLl7","isFallback":false,"isExperimentalCompile":false,"dynamicIds":[84888],"gssp":true,"scriptLoader":[]}