Study of the Structural, Morphological and Optical Properties of Pure and Doped SrS Thin Films Prepared by Chemical Bath Deposition

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Abstract Thin film of pure and Nickel sulphate (NiSO4), Ocimum tenuiflorum (TULSI LEAF) doped Strontium sulfide (SrS) were prepared by chemical bath deposition technique. The films are prepared by 1M concentration and annealed at a temperature of 200K. The structural, morphological and composition of the thin films were investigated by X-ray diffraction, scanning electron microscopy (SEM), and energy dispersive analysis spectrum (EDAX) respectively. XRD reveals the cubic structure of the prepared films. SEM results showed the surface morphology of the samples. EDAX spectrum confirms to presence the all the compound. The optical properties of the films are measured to determine the absorption, and also the band gap values with the help of UV. From the PL spectra revealed the effect of impurities on the absorption and emission of both pure and doped SrS thin films.
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Study of the Structural, Morphological and Optical Properties of Pure and Doped SrS Thin Films Prepared by Chemical Bath Deposition | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article Study of the Structural, Morphological and Optical Properties of Pure and Doped SrS Thin Films Prepared by Chemical Bath Deposition NANDHAKUMAR N This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-6635303/v1 This work is licensed under a CC BY 4.0 License Status: Posted Version 1 posted You are reading this latest preprint version Abstract Thin film of pure and Nickel sulphate (NiSO 4 ), Ocimum tenuiflorum (TULSI LEAF) doped Strontium sulfide (SrS) were prepared by chemical bath deposition technique. The films are prepared by 1M concentration and annealed at a temperature of 200K. The structural, morphological and composition of the thin films were investigated by X-ray diffraction, scanning electron microscopy (SEM), and energy dispersive analysis spectrum (EDAX) respectively. XRD reveals the cubic structure of the prepared films. SEM results showed the surface morphology of the samples. EDAX spectrum confirms to presence the all the compound. The optical properties of the films are measured to determine the absorption, and also the band gap values with the help of UV. From the PL spectra revealed the effect of impurities on the absorption and emission of both pure and doped SrS thin films. Soft Condensed-matter Physics CBD method XRD UV PL Figures Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Figure 7 INTRODUCTION Most studied nanostructured semiconductors belong to II-VI and IV-VI groups are relatively easy to synthesize and generally are prepared as particles or thin film. Semiconductor thin films are prepared by wet and dry deposition techniques. In chemical bath deposition (CBD) technique simple, cheap, and feasible for obtaining different semiconductors high quality films even at temperature. It is necessary to control the parameters pH, temperature, reagents concentration and reaction time to ensure the film quality and homogeneity. Strontium sulfide (𝑆𝑟𝑆) thin films have many applications in physics, including in solar cells, infrared detectors, and electroluminescent devices. Solar cells : Strontium sulfide's redox chemical valences make it a good material for photovoltaic solar cells. Infrared detectors : Strontium sulfide thin films are used in infrared detectors. Electroluminescent devices : Strontium sulfide is a Lenard phosphor that can be used in full-color electroluminescent devices. Optical storage media : Strontium sulfide thin films can be used in optical storage media. Doping thin films with metal ions can change their optical properties, making them useful for a variety of applications. These applications include solar cells, flat-panel displays, and gas sensors. In This paper reveals the structural, morphological, and optical of pure and doped Strontium sulfide thin films. In this present work Nickel sulphate (NiSO 4 ) (NS) and Ocimum tenuiflorum (OT) (TULSI LEAF) are the dopant materials. The dopants enhance the properties of the strontium sulfide. EXPERIMENTAL PROCEDURE Soda lime glass was used as the substrate for SrS thin film deposition. The substrates were cleaned thoroughly in distilled water to remove surface impurities. They were then washed in deionized water and subjected to ultrasonic agitation in distilled water for 15 minutes. Thiourea was used as the sulfide ion source and Strontium Nitrate (Sr(NO₃)₂) was used as the strontium ion source in an ammonia bath. 100 ml of distilled water was heated to 70°C and the glass substrates were immersed. 0.4M of Strontium Nitrate was added slowly while stirring. Ammonia solution (NH₃) was then introduced, reducing the temperature slightly. 0.04M thiourea was added gradually, turning the solution whitish, indicating SrS formation. Nickel Sulfate (0.002M) and Ocimum Tenuiflorum extract (10 ml) were separately introduced into the SrS solution. The pH was maintained at 10 throughout the experiment. The films were left in the solution for 60 minutes for uniform deposition. After deposition, the substrates were removed, washed with distilled water, and dried at 100°C for 15 minutes. RESULTS AND DISCUSSION X-RAY DIFFRACTION ANALYSIS The above figures show the XRD pattern obtained for SrS, SrS:NiSO 4 and SrS:OT thin films. Peak position present in the recorded XRD patterns are in accordance with the standard values in JCPDS No: 08-0489. Diffraction peaks are noted in XRD patterns confirm that films have a polycrystalline structure. The well sharp peaks observed at diffraction angles 25.4⁰, 33.4⁰, 42.4⁰, 50.4⁰, and 54.4⁰ correspond to (111), (200), (220), (311), and (222) planes, respectively. Addition of dopants of NS and OT with 1M concentration did not alter the basic structure but there is a slight variation in the lattice parameters. It is observed that, the peaks are shifted towards higher diffraction angles with addition of dopants. Thus, incorporation of Ni 2+ and OT removes the nitrogen ions to retain the charge neutrality of the host matrix. EDAX ANALYSIS Figure 2 displays the EDAX spectra of pure and doped SrS thin films formed by CBD method. All the thin films layers showed the presence Strontium, Sulfur, Nickel and other organic compounds. The formation of pure SrS thin films is confirmed by the existence of Sr and S. The creation of NS doped SrS thin films show the presence of Sr, S and Ni related peaks. Similarly OT doped SrS thin films show the presence of Sr, S, and other organic compounds that has been shown in the figure below. SEM ANALYSIS The morphological images of the pure and doped SrS thin films obtained using scanning electron microscopy are shown in the Fig. 3. It revealed that surface characteristics of isolated big grains deposited on the surface formed with very small grains. The grain size is increased with increase in the deposition time. NS and OT doped SrS thin films grain sizes also increased. OPTICAL PROPERTY ANALYSIS The optical properties of prepared thin films can be determined by UV spectrometer. The optical absorption of pure and doped SrS deposited thin films were examined using wavelength ranging from 200-900nm. Strong absorption peaks of pure and doped SrS thin films were absorbed by the 300-350nm. By measuring the thickness of the prepared thin films and absorption coefficient to computed and also the bandgap of the deposited films were calculated.. α \(\:=\frac{2.303*A}{d}\) Where, d is the thickness and A is the absorbance of the films. From the taucs plots, the optical energy bandgap of deposited films were predicted. The bandgap energy of as deposited films are listed in Table 1 . The Nickel sulphate doped SrS slightly increases the bandgap due to defect states, enhancing visible light absorption. It enhanced optical conductivity hence it is suitable photodetectors. OT doped SrS show increase in the bandgap due to lattice strain or quantum effects, making it better for UV applications. The improved transparency in the visible region shows that it is useful for photodetectors applications. . Table 1 Bandgap energy of deposited films S.No MATERIAL BANDGAP ENERGY (eV) 1 Pure SrS 3.91 2 NS doped SrS 3.93 3 OT doped SrS 4.01 PHOTOLUMINESCENES ANALYSIS The prepared samples are subjected to PL analysis. It provides insights into the optical properties of the pure and doped SrS thin films. SrS is a well-known phosphor material that exhibits strong luminescence. The peak at 435nm (2.85 eV) shows near band edge emission. This emission suggests that both dopants influence the band structure of SrS, possibly by creating shallow defect states near the conduction band. The shift to 435nm compared to pure SrS could indicate a bandgap widening due to quantum confinement effects or strain in the thin films. For Ni-doped SrS: Ni²⁺ ions could be creating localized states within the SrS bandgap, altering electron-hole recombination dynamics. For Ocimum Tenuiflorum doped SrS: Bio-organic molecules may be influencing defect states or passivating surface defects,leading to an altered emission profile. The peak at 657nm (1.88 eV) shows deep-level defect Emission. This red emission is likely due to deep-level defects, such as sulfur vacancies (V_S) or interstitial Sr²⁺ ions, acting as trap states. Both Ni and Ocimum Tenuiflorum extract may be enhancing these defects, leading to similar emissions. For Ni-doped SrS: Ni²⁺ might be introducing mid-gap states, allowing non-radiative recombination and defect-related transitions. For Ocimum Tenuiflorum doped SrS: Organic compounds may be interacting with oxygen/sulfur vacancies, stabilizing deep-level defects responsible for red emission. Optoelectronic Devices , Blue (435 nm) and Red (657 nm) Emission: These wavelengths are useful for designing multi-color LEDs and display technologies. Nickel- doped SrS: May provide enhanced stability and tenability for phosphor-based lighting applications. Thulasi-doped SrS bio-extract improves film uniformity or emission intensity, it can be used for eco-friendly luminescent materials. Photodetectors , The dual- wavelength response makes these materials suitable for broad-spectrum photodetection, particularly in the visible region. Nickel doping may improve charge carrier mobility and sensitivity, making it suitable for UV-Visible photodetectors. Thulasi extract doping could lead to enhanced defect states, beneficial for low-cost, bio-inspired sensing materials. Biomedical Fluorescent Probes , have emission at 435 nm and 657 nm allow use in bio-imaging applications particularly for fluorescence microscopy. Nickel doping could affect biocompatibility, but Thulasi extract doping might offer biodegradability and reduced toxicity, making it a good candidate for bio-imaging and medical diagnostics. Energy Storage & Photovoltaics , the wide optical absorption range (blue to red) makes these materials suitable for solar cell applications. Nickel doping could improve charge transfer, enhancing performance in photoelectrochemical (PEC) cells. Thulasi extract may introduce additional electronic states that influence energy conversion efficiency. Optical Sensors , Dual-wavelength emission can be useful for temperature sensors, chemical sensors, and biosensors. Ni-doped SrS could enhance chemical stability, making it useful for gas or humidity sensing. Thulasi-doped SrS may be useful for environmental sensing due to its eco- friendly nature. TGA ANALYSIS The Thermogravimetric Analysis (TGA) graph shows the weight loss of pure and doped SrS thin films as a function of temperature. Initial Region (Below 100°C): A slight weight loss is observed, likely due to the evaporation of absorbed moisture or solvent residues. 100–250°C: A significant weight loss occurs, indicating the decomposition of organic residues or volatile components from the precursor materials. Above 250°C: The weight stabilizes, suggesting that the films have reached thermal stability, with minimal further decomposition. Pure SrS shows slightly higher weight loss initially, indicating more absorbed moisture or precursor residues. NS Doped SrS displays intermediate weight loss, suggesting better thermal stability compared to pure SrS. OT Doped SrS exhibits the least weight loss, indicating the highest thermal stability among the samples. Based on thermal analysis applications Optoelectronics: Due to improved thermal stability, doped SrS films can be used in LEDs, phosphors, and photodetectors. Sensors: The thermal resilience makes them suitable for high-temperature gas sensors. Thin-Film Coatings: Stable optical properties at elevated temperatures make these films suitable for anti-reflective and protective coatings. CONCLUSION In the present study, transparent and well adhered pure and doped SrS thin films were effectively deposited on glass substrates at that the rates of 60min using a straight forward method of CBD. The structural, morphological and optical characteristics were examined and reported using various characterization techniques. It was inferred from the XRD results that the strontium sulfide was polycrystalline cubic structure in all thin films. The optical studies revealed that the bandgap energy varied with doping, with NiSO 4 doped SrS showing a slightly increased bandgap (3.88eV) and Ocimum tenuiflorum doped SrS exhibiting increased bandgap (4.00eV). The PL demonstrated that NiSO 4 doping suppressed the 435nm emission and enhanced the 657nm due to deep level defects. Ocimum tenuiflorum doped SrS maintained both emissions but it modified intensity, likely due to organic molecule interactions and defect passivation. The thermal analysis reveals that the prepared materials were have good thermal stability. These findings suggest that pure and doped SrS thin films have promising applications in optoelectronics, sensors, photodetectors, bio-imaging, and energy storage applications. Declarations Acknowledgements These authors sincerely acknowledge Department of Physics, Government Arts College, Coimbatore, for proving lab facilities encouragement, and support throughout the research work. Credit authorship contribution statement N.Nandhakumar: Data curation, writing- original draft , editing. G.Umadevi: Investigation, conceptualization, supervision, Formal analysis. D.Kathirvel: Investigation, Formal analysis. R.Anandhakumar: editing, K.Santhoshi: Data curation. Conflict of interest The Authors declares that there is no conflict of interest anywhere. Data and code availability The data that support the findings of this study are available from the corresponding author upon reasonable request. Supplementary Information No supplementary material is provided. Ethical Approval This study does not involve human participants, animal subjects, or biological samples requiring ethical approval. All experiments were conducted in accordance with institutional safety and research guidelines. References H. Kobayashi and S. Tanaka, in: Proc. 5th Intern. Work-shop on Electroluminescence, Helsinki, 1990, Acta Poly-tech. Scand., Appl. Phys. Ser. No. 170 (1990) 69. R.H. Mauch, K.O. Velthaus, H.W. Schock, S. Tanaka and H. Kobayashi, in: 1992 SID Intern. Symp. Digest Tech. Papers, Boston, MA, 1992, p. 178. R.H. Mauch, K.O. Velthaus, B. Hiittl and H.W. Schock, in: 1993 SID Intern. Symp. Digest Tech. Papers, Seattle, WA, 1993, p. 769. K.O. Velthaus, R.H. Mauch and H.W. Schock, Adv.Mater. Opt. Electron. 2 (1993), in press. Y. Takeuchi, Y. Okuno, T. 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Ning, Z. Dongmei, S. Yingzhong, J. Rare Earths 28 (2010) 391–395. C. Karner, P. Maguire, J. McLaughlin, S. Laverty, Philos. Mag. Lett. 76 (1997) 111–116. Additional Declarations The authors declare no competing interests. Cite Share Download PDF Status: Posted Version 1 posted You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. Our growing team is made up of researchers and industry professionals working together to solve the most critical problems facing scientific publishing. Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-6635303","acceptedTermsAndConditions":true,"allowDirectSubmit":true,"archivedVersions":[],"articleType":"Research Article","associatedPublications":[],"authors":[{"id":454704495,"identity":"152405a7-0d9a-4ebb-a5ef-e029b1826101","order_by":0,"name":"NANDHAKUMAR 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3","display":"","copyAsset":false,"role":"figure","size":427550,"visible":true,"origin":"","legend":"\u003cp\u003e\u003cstrong\u003e(a) SEM analysis Pure SrS (b) SEM analysis of NS doped SrS (c) SEM analysis of OT doped SrS\u003c/strong\u003e\u003c/p\u003e","description":"","filename":"3.png","url":"https://assets-eu.researchsquare.com/files/rs-6635303/v1/1c419060ee1d1027aa811c20.png"},{"id":82567539,"identity":"c30a0908-81c4-411c-90dd-e5d06d8deef1","added_by":"auto","created_at":"2025-05-13 03:14:23","extension":"png","order_by":4,"title":"Figure 4","display":"","copyAsset":false,"role":"figure","size":78346,"visible":true,"origin":"","legend":"\u003cp\u003e\u003cstrong\u003e(a) UV Spectrum of Pure SrS (b) UV Spectrum of NS doped SrS (c) UV Spectrum of OT doped 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03:38:29","extension":"pdf","order_by":0,"title":"","display":"","copyAsset":false,"role":"manuscript-pdf","size":1790364,"visible":true,"origin":"","legend":"","description":"","filename":"manuscript.pdf","url":"https://assets-eu.researchsquare.com/files/rs-6635303/v1/c81cd396-faf4-4ad6-9259-fde39a350e21.pdf"}],"financialInterests":"The authors declare no competing interests.","formattedTitle":"\u003cp\u003e\u003cstrong\u003eStudy of the Structural, Morphological and Optical Properties of Pure and Doped SrS Thin Films Prepared by Chemical Bath Deposition\u003c/strong\u003e\u003c/p\u003e","fulltext":[{"header":"INTRODUCTION","content":"\u003cp\u003eMost studied nanostructured semiconductors belong to II-VI and IV-VI groups are relatively easy to synthesize and generally are prepared as particles or thin film. Semiconductor thin films are prepared by wet and dry deposition techniques. In chemical bath deposition (CBD) technique simple, cheap, and feasible for obtaining different semiconductors high quality films even at temperature. It is necessary to control the parameters pH, temperature, reagents concentration and reaction time to ensure the film quality and homogeneity. Strontium sulfide (\u0026#119878;\u0026#119903;\u0026#119878;) thin films have many applications in physics, including in solar cells, infrared detectors, and electroluminescent devices. \u003cb\u003eSolar cells\u003c/b\u003e: Strontium sulfide's redox chemical valences make it a good material for photovoltaic solar cells. \u003cb\u003eInfrared detectors\u003c/b\u003e: Strontium sulfide thin films are used in infrared detectors. \u003cb\u003eElectroluminescent devices\u003c/b\u003e: Strontium sulfide is a Lenard phosphor that can be used in full-color electroluminescent devices. \u003cb\u003eOptical storage media\u003c/b\u003e: Strontium sulfide thin films can be used in optical storage media. Doping thin films with metal ions can change their optical properties, making them useful for a variety of applications. These applications include solar cells, flat-panel displays, and gas sensors. In This paper reveals the structural, morphological, and optical of pure and doped Strontium sulfide thin films. In this present work Nickel sulphate (NiSO\u003csub\u003e4\u003c/sub\u003e) (NS) and Ocimum tenuiflorum (OT) (TULSI LEAF) are the dopant materials. The dopants enhance the properties of the strontium sulfide.\u003c/p\u003e"},{"header":"EXPERIMENTAL PROCEDURE","content":"\u003cp\u003eSoda lime glass was used as the substrate for SrS thin film deposition. The substrates were cleaned thoroughly in distilled water to remove surface impurities. They were then washed in deionized water and subjected to ultrasonic agitation in distilled water for 15 minutes. Thiourea was used as the sulfide ion source and Strontium Nitrate (Sr(NO₃)₂) was used as the strontium ion source in an ammonia bath. 100 ml of distilled water was heated to 70\u0026deg;C and the glass substrates were immersed. 0.4M of Strontium Nitrate was added slowly while stirring. Ammonia solution (NH₃) was then introduced, reducing the temperature slightly. 0.04M thiourea was added gradually, turning the solution whitish, indicating SrS formation. Nickel Sulfate (0.002M) and Ocimum Tenuiflorum extract (10 ml) were separately introduced into the SrS solution. The pH was maintained at 10 throughout the experiment. The films were left in the solution for 60 minutes for uniform deposition. After deposition, the substrates were removed, washed with distilled water, and dried at 100\u0026deg;C for 15 minutes.\u003c/p\u003e"},{"header":"RESULTS AND DISCUSSION","content":"\u003cdiv id=\"Sec4\" class=\"Section2\"\u003e \u003ch2\u003eX-RAY DIFFRACTION ANALYSIS\u003c/h2\u003e \u003cp\u003e \u003c/p\u003e \u003cp\u003eThe above figures show the XRD pattern obtained for SrS, SrS:NiSO\u003csub\u003e4\u003c/sub\u003e and SrS:OT thin films. Peak position present in the recorded XRD patterns are in accordance with the standard values in JCPDS No: 08-0489. Diffraction peaks are noted in XRD patterns confirm that films have a polycrystalline structure. The well sharp peaks observed at diffraction angles 25.4⁰, 33.4⁰, 42.4⁰, 50.4⁰, and 54.4⁰ correspond to (111), (200), (220), (311), and (222) planes, respectively. Addition of dopants of NS and OT with 1M concentration did not alter the basic structure but there is a slight variation in the lattice parameters. It is observed that, the peaks are shifted towards higher diffraction angles with addition of dopants. Thus, incorporation of Ni\u003csup\u003e2+\u003c/sup\u003e and OT removes the nitrogen ions to retain the charge neutrality of the host matrix.\u003c/p\u003e \u003c/div\u003e\n\u003ch3\u003eEDAX ANALYSIS\u003c/h3\u003e\n\u003cp\u003eFigure\u0026nbsp;\u003cspan refid=\"Fig2\" class=\"InternalRef\"\u003e2\u003c/span\u003e displays the EDAX spectra of pure and doped SrS thin films formed by CBD method. All the thin films layers showed the presence Strontium, Sulfur, Nickel and other organic compounds. The formation of pure SrS thin films is confirmed by the existence of Sr and S. The creation of NS doped SrS thin films show the presence of Sr, S and Ni related peaks. Similarly OT doped SrS thin films show the presence of Sr, S, and other organic compounds that has been shown in the figure below.\u003c/p\u003e \n\u003cdiv id=\"Sec7\" class=\"Section2\"\u003e \u003ch2\u003eSEM ANALYSIS\u003c/h2\u003e \u003cp\u003eThe morphological images of the pure and doped SrS thin films obtained using scanning electron microscopy are shown in the Fig.\u0026nbsp;3. It revealed that surface characteristics of isolated big grains deposited on the surface formed with very small grains. The grain size is increased with increase in the deposition time. NS and OT doped SrS thin films grain sizes also increased.\u003c/p\u003e \n\u003cdiv id=\"Sec10\" class=\"Section2\"\u003e \u003ch2\u003eOPTICAL PROPERTY ANALYSIS\u003c/h2\u003e \u003cp\u003eThe optical properties of prepared thin films can be determined by UV spectrometer. The optical absorption of pure and doped SrS deposited thin films were examined using wavelength ranging from 200-900nm. Strong absorption peaks of pure and doped SrS thin films were absorbed by the 300-350nm. By measuring the thickness of the prepared thin films and absorption coefficient to computed and also the bandgap of the deposited films were calculated..\u003c/p\u003e \u003cp\u003eα\u003cspan class=\"InlineEquation\"\u003e\u003cspan class=\"mathinline\"\u003e\\(\\:=\\frac{2.303*A}{d}\\)\u003c/span\u003e\u003c/span\u003e\u003c/p\u003e \u003cp\u003eWhere, d is the thickness and A is the absorbance of the films. From the taucs plots, the optical energy bandgap of deposited films were predicted. The bandgap energy of as deposited films are listed in Table \u003cspan refid=\"Tab1\" class=\"InternalRef\"\u003e1\u003c/span\u003e. The Nickel sulphate doped SrS slightly increases the bandgap due to defect states, enhancing visible light absorption. It enhanced optical conductivity hence it is suitable photodetectors. OT doped SrS show increase in the bandgap due to lattice strain or quantum effects, making it better for UV applications. The improved transparency in the visible region shows that it is useful for photodetectors applications. .\u003c/p\u003e \u003cp\u003e \u003c/p\u003e \u003cp\u003e \u003cdiv class=\"gridtable\"\u003e\u003ctable float=\"Yes\" id=\"Tab1\" border=\"1\"\u003e \u003ccaption language=\"En\"\u003e \u003cdiv class=\"CaptionNumber\"\u003eTable 1\u003c/div\u003e \u003cdiv class=\"CaptionContent\"\u003e \u003cp\u003eBandgap energy of deposited films\u003c/p\u003e \u003c/div\u003e \u003c/caption\u003e \u003ccolgroup cols=\"3\"\u003e \u003cdiv align=\"left\" class=\"colspec\" colname=\"c1\" colnum=\"1\"\u003e\u003c/div\u003e \u003cdiv align=\"left\" class=\"colspec\" colname=\"c2\" colnum=\"2\"\u003e\u003c/div\u003e \u003cdiv align=\"left\" class=\"colspec\" colname=\"c3\" colnum=\"3\"\u003e\u003c/div\u003e \u003cthead\u003e \u003ctr\u003e \u003cth align=\"left\" colname=\"c1\"\u003e \u003cp\u003eS.No\u003c/p\u003e \u003c/th\u003e \u003cth align=\"left\" colname=\"c2\"\u003e \u003cp\u003eMATERIAL\u003c/p\u003e \u003c/th\u003e \u003cth align=\"left\" colname=\"c3\"\u003e \u003cp\u003eBANDGAP ENERGY\u003c/p\u003e \u003cp\u003e(eV)\u003c/p\u003e \u003c/th\u003e \u003c/tr\u003e \u003ctr\u003e \u003cth align=\"left\" colname=\"c1\"\u003e \u003cp\u003e1\u003c/p\u003e \u003c/th\u003e \u003cth align=\"left\" colname=\"c2\"\u003e \u003cp\u003ePure SrS\u003c/p\u003e \u003c/th\u003e \u003cth align=\"left\" colname=\"c3\"\u003e \u003cp\u003e3.91\u003c/p\u003e \u003c/th\u003e \u003c/tr\u003e \u003ctr\u003e \u003cth align=\"left\" colname=\"c1\"\u003e \u003cp\u003e2\u003c/p\u003e \u003c/th\u003e \u003cth align=\"left\" colname=\"c2\"\u003e \u003cp\u003eNS doped SrS\u003c/p\u003e \u003c/th\u003e \u003cth align=\"left\" colname=\"c3\"\u003e \u003cp\u003e3.93\u003c/p\u003e \u003c/th\u003e \u003c/tr\u003e \u003c/thead\u003e \u003ctbody\u003e \u003ctr\u003e \u003ctd align=\"left\" colname=\"c1\"\u003e \u003cp\u003e\u003cb\u003e3\u003c/b\u003e\u003c/p\u003e \u003c/td\u003e \u003ctd align=\"left\" colname=\"c2\"\u003e \u003cp\u003e\u003cb\u003eOT doped SrS\u003c/b\u003e\u003c/p\u003e \u003c/td\u003e \u003ctd align=\"char\" char=\".\" colname=\"c3\"\u003e \u003cp\u003e\u003cb\u003e4.01\u003c/b\u003e\u003c/p\u003e \u003c/td\u003e \u003c/tr\u003e \u003c/tbody\u003e \u003c/colgroup\u003e \u003c/table\u003e\u003c/div\u003e \u003c/p\u003e \u003cp\u003e \u003c/p\u003e \u003c/div\u003e \u003cdiv id=\"Sec11\" class=\"Section2\"\u003e \u003ch2\u003ePHOTOLUMINESCENES ANALYSIS\u003c/h2\u003e \u003cp\u003eThe prepared samples are subjected to PL analysis. It provides insights into the optical properties of the pure and doped SrS thin films. SrS is a well-known phosphor material that exhibits strong luminescence. The peak at 435nm (2.85 eV) shows near band edge emission. This emission suggests that both dopants influence the band structure of SrS, possibly by creating shallow defect states near the conduction band. The shift to 435nm compared to pure SrS could indicate a bandgap widening due to quantum confinement effects or strain in the thin films. For Ni-doped SrS: Ni\u0026sup2;⁺ ions could be creating localized states within the SrS bandgap, altering electron-hole recombination dynamics. For Ocimum Tenuiflorum doped SrS: Bio-organic molecules may be influencing defect states or passivating surface defects,leading to an altered emission profile. The peak at 657nm (1.88 eV) shows deep-level defect Emission. This red emission is likely due to deep-level defects, such as sulfur vacancies (V_S) or interstitial Sr\u0026sup2;⁺ ions, acting as trap states. Both Ni and Ocimum Tenuiflorum extract may be enhancing these defects, leading to similar emissions. For Ni-doped SrS: Ni\u0026sup2;⁺ might be introducing mid-gap states, allowing non-radiative recombination and defect-related transitions. For Ocimum Tenuiflorum doped SrS: Organic compounds may be interacting with oxygen/sulfur vacancies, stabilizing deep-level defects responsible for red emission.\u003c/p\u003e \u003cp\u003e \u003cb\u003eOptoelectronic Devices\u003c/b\u003e, Blue (435 nm) and Red (657 nm) Emission: These wavelengths are useful for designing multi-color LEDs and display technologies. Nickel- doped SrS: May provide enhanced stability and tenability for phosphor-based lighting applications. Thulasi-doped SrS bio-extract improves film uniformity or emission intensity, it can be used for eco-friendly luminescent materials. \u003cb\u003ePhotodetectors\u003c/b\u003e, The dual- wavelength response makes these materials suitable for broad-spectrum photodetection, particularly in the visible region. Nickel doping may improve charge carrier mobility and sensitivity, making it suitable for UV-Visible photodetectors. Thulasi extract doping could lead to enhanced defect states, beneficial for low-cost, bio-inspired sensing materials.\u003c/p\u003e \u003cp\u003e \u003cb\u003eBiomedical Fluorescent Probes\u003c/b\u003e, have emission at 435 nm and 657 nm allow use in bio-imaging applications particularly for fluorescence microscopy. Nickel doping could affect biocompatibility, but Thulasi extract doping might offer biodegradability and reduced toxicity, making it a good candidate for bio-imaging and medical diagnostics. \u003cb\u003eEnergy Storage \u0026amp; Photovoltaics\u003c/b\u003e, the wide optical absorption range (blue to red) makes these materials suitable for solar cell applications. Nickel doping could improve charge transfer, enhancing performance in photoelectrochemical (PEC) cells. Thulasi extract may introduce additional electronic states that influence energy conversion efficiency. \u003cb\u003eOptical Sensors\u003c/b\u003e, Dual-wavelength emission can be useful for temperature sensors, chemical sensors, and biosensors. Ni-doped SrS could enhance chemical stability, making it useful for gas or humidity sensing. Thulasi-doped SrS may be useful for environmental sensing due to its eco- friendly nature.\u003c/p\u003e \u003c/div\u003e \u003cdiv id=\"Sec12\" class=\"Section2\"\u003e \u003ch2\u003eTGA ANALYSIS\u003c/h2\u003e \u003cp\u003eThe Thermogravimetric Analysis (TGA) graph shows the weight loss of pure and doped SrS thin films as a function of temperature. Initial Region (Below 100\u0026deg;C): A slight weight loss is observed, likely due to the evaporation of absorbed moisture or solvent residues. 100\u0026ndash;250\u0026deg;C: A significant weight loss occurs, indicating the decomposition of organic residues or volatile components from the precursor materials. Above 250\u0026deg;C: The weight stabilizes, suggesting that the films have reached thermal stability, with minimal further decomposition. Pure SrS shows slightly higher weight loss initially, indicating more absorbed moisture or precursor residues. NS Doped SrS displays intermediate weight loss, suggesting better thermal stability compared to pure SrS. OT Doped SrS exhibits the least weight loss, indicating the highest thermal stability among the samples.\u003c/p\u003e \u003c/div\u003e \u003cdiv id=\"Sec13\" class=\"Section2\"\u003e \u003ch2\u003eBased on thermal analysis applications\u003c/h2\u003e \u003cp\u003eOptoelectronics: Due to improved thermal stability, doped SrS films can be used in LEDs, phosphors, and photodetectors. Sensors: The thermal resilience makes them suitable for high-temperature gas sensors. Thin-Film Coatings: Stable optical properties at elevated temperatures make these films suitable for anti-reflective and protective coatings.\u003c/p\u003e \u003c/div\u003e"},{"header":"CONCLUSION","content":"\u003cp\u003eIn the present study, transparent and well adhered pure and doped SrS thin films were effectively deposited on glass substrates at that the rates of 60min using a straight forward method of CBD. The structural, morphological and optical characteristics were examined and reported using various characterization techniques. It was inferred from the XRD results that the strontium sulfide was polycrystalline cubic structure in all thin films. The optical studies revealed that the bandgap energy varied with doping, with NiSO\u003csub\u003e4\u003c/sub\u003e doped SrS showing a slightly increased bandgap (3.88eV) and Ocimum tenuiflorum doped SrS exhibiting increased bandgap (4.00eV). The PL demonstrated that NiSO\u003csub\u003e4\u003c/sub\u003e doping suppressed the 435nm emission and enhanced the 657nm due to deep level defects. Ocimum tenuiflorum doped SrS maintained both emissions but it modified intensity, likely due to organic molecule interactions and defect passivation. The thermal analysis reveals that the prepared materials were have good thermal stability. These findings suggest that pure and doped SrS thin films have promising applications in optoelectronics, sensors, photodetectors, bio-imaging, and energy storage applications.\u003c/p\u003e"},{"header":"Declarations","content":"\u003cp\u003e\u003cstrong\u003eAcknowledgements\u0026nbsp;\u003c/strong\u003e\u003c/p\u003e\n\u003cp\u003eThese authors sincerely acknowledge Department of Physics, Government Arts College, Coimbatore, for proving lab facilities encouragement, and support throughout the research work. \u0026nbsp; \u0026nbsp;\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eCredit authorship contribution statement\u0026nbsp;\u003c/strong\u003e\u003c/p\u003e\n\u003cp\u003eN.Nandhakumar: Data curation, writing- original draft , editing. G.Umadevi: Investigation, conceptualization, supervision, Formal analysis. D.Kathirvel: Investigation, Formal analysis. R.Anandhakumar: editing, K.Santhoshi: Data curation.\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eConflict of interest\u003c/strong\u003e\u003c/p\u003e\n\u003cp\u003eThe Authors declares that there is no conflict of interest anywhere.\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eData and code availability\u003c/strong\u003e\u003c/p\u003e\n\u003cp\u003eThe data that support the findings of this study are available from the corresponding author upon reasonable request. \u0026nbsp;\u0026nbsp;\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eSupplementary Information\u0026nbsp;\u003c/strong\u003e\u003c/p\u003e\n\u003cp\u003eNo supplementary material is provided.\u003c/p\u003e\n\u003cp\u003e\u003cstrong\u003eEthical Approval\u0026nbsp;\u003c/strong\u003e\u003c/p\u003e\n\u003cp\u003eThis study does not involve human participants, animal subjects, or biological samples requiring ethical approval. \u0026nbsp;All experiments were conducted in accordance with institutional safety and research guidelines.\u0026nbsp;\u003c/p\u003e"},{"header":"References","content":"\u003col\u003e\n \u003cli\u003eH. 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Kobayashi, J.Appl Physics, Vol 78, pp428 1995.\u003c/li\u003e\n \u003cli\u003eS.Okamato,T.Kuki and T.Suzuki,\u0026rdquo;SrS:Ce Thin film Electroluminescent Devices Fabricated \u0026nbsp;by \u0026nbsp;Post- \u0026nbsp;Annealing \u0026nbsp;Technique \u0026nbsp;and \u0026nbsp;their \u0026nbsp;Electrical \u0026nbsp;properties,\u0026rdquo; Jpn.J.Appl.Phy,vol.32,no.4,pp.1672- 1680,April 1993\u003c/li\u003e\n \u003cli\u003eT.Morishita,H.Matsuyama,M.Matsui\u0026nbsp;and\u0026nbsp;M.Wakihara,\u0026rdquo;\u0026nbsp;Fffects\u0026nbsp;of\u0026nbsp;Post-Annealing\u0026nbsp;in\u0026nbsp;H2S on Photo and Electroluminescent properties of SrS:Ce Thin Film,\u0026rdquo; Jpn.J.Appl.Phy.vol.38,no.12A,pp6732- 6734,December1999.\u003c/li\u003e\n \u003cli\u003eP.D.Keir,C.Maddix,A.Baukol,J.F.Wagor,\u0026rdquo;Lanthanii de\u0026nbsp;doping\u0026nbsp;in ZnS and\u0026nbsp;SrS\u0026nbsp;thin-film electroluminescent devices\u0026rdquo;, J.Appl.Phy.vol.86,no12.pp 6810-6815,December 1999\u003c/li\u003e\n \u003cli\u003eP.D.\u0026nbsp;Keir,\u0026nbsp;J.F.\u0026nbsp;Wager,\u0026nbsp;B.L.\u0026nbsp;Clark,\u0026nbsp;D.\u0026nbsp;Li,\u0026nbsp;D.A.\u0026nbsp;Keszler,\u0026nbsp;Appl.\u0026nbsp;Phys.\u0026nbsp;Lett.\u0026nbsp;75\u0026nbsp;(1999) 1398.\u003c/li\u003e\n \u003cli\u003eE.I.\u0026nbsp;Anila,\u0026nbsp;A.\u0026nbsp;Arvind,\u0026nbsp;M.K.\u0026nbsp;Jayaraj,\u0026nbsp;Nanotechnology\u0026nbsp;19\u0026nbsp;(2008)\u0026nbsp;145604.\u003c/li\u003e\n \u003cli\u003eK.\u0026nbsp;Korthout,\u0026nbsp;P.F.\u0026nbsp;Smet,\u0026nbsp;D.\u0026nbsp;Poelman,\u0026nbsp;Appl.\u0026nbsp;Phys. 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A \u0026ndash; Mater. 96 (2009) 197\u0026ndash;205.\u003c/li\u003e\n \u003cli\u003eD.\u0026nbsp;Fangli,\u0026nbsp;W.\u0026nbsp;Ning,\u0026nbsp;Z.\u0026nbsp;Dongmei,\u0026nbsp;S.\u0026nbsp;Yingzhong,\u0026nbsp;J.\u0026nbsp;Rare\u0026nbsp;Earths\u0026nbsp;28\u0026nbsp;(2010)\u0026nbsp;391\u0026ndash;395.\u003c/li\u003e\n \u003cli\u003eC. Karner, P. Maguire, J. McLaughlin, S. Laverty, Philos. Mag. Lett. 76 (1997) 111\u0026ndash;116.\u003c/li\u003e\n\u003c/ol\u003e"}],"fulltextSource":"","fullText":"","funders":[],"hasAdminPriorityOnWorkflow":false,"hasManuscriptDocX":true,"hasOptedInToPreprint":true,"hasPassedJournalQc":"","hasAnyPriority":true,"hideJournal":true,"highlight":"","institution":"Bharathiar University","isAcceptedByJournal":false,"isAuthorSuppliedPdf":false,"isDeskRejected":"","isHiddenFromSearch":false,"isInQc":false,"isInWorkflow":false,"isPdf":false,"isPdfUpToDate":true,"isWithdrawnOrRetracted":false,"journal":{"display":true,"email":"[email protected]","identity":"researchsquare","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":true,"externalIdentity":"","sideBox":"","snPcode":"","submissionUrl":"/submission","title":"Research Square","twitterHandle":"researchsquare","acdcEnabled":true,"dfaEnabled":false,"editorialSystem":"","reportingPortfolio":"","inReviewEnabled":false,"inReviewRevisionsEnabled":true},"keywords":"CBD method, XRD, UV, PL","lastPublishedDoi":"10.21203/rs.3.rs-6635303/v1","lastPublishedDoiUrl":"https://doi.org/10.21203/rs.3.rs-6635303/v1","license":{"name":"CC BY 4.0","url":"https://creativecommons.org/licenses/by/4.0/"},"manuscriptAbstract":"\u003cp\u003eThin film of pure and Nickel sulphate (NiSO\u003csub\u003e4\u003c/sub\u003e), Ocimum tenuiflorum (TULSI LEAF) doped Strontium sulfide (SrS) were prepared by chemical bath deposition technique. The films are prepared by 1M concentration and annealed at a temperature of 200K. The structural, morphological and composition of the thin films were investigated by X-ray diffraction, scanning electron microscopy (SEM), and energy dispersive analysis spectrum (EDAX) respectively. XRD reveals the cubic structure of the prepared films. SEM results showed the surface morphology of the samples. EDAX spectrum confirms to presence the all the compound. The optical properties of the films are measured to determine the absorption, and also the band gap values with the help of UV. From the PL spectra revealed the effect of impurities on the absorption and emission of both pure and doped SrS thin films.\u003c/p\u003e","manuscriptTitle":"Study of the Structural, Morphological and Optical Properties of Pure and Doped SrS Thin Films Prepared by Chemical Bath Deposition","msid":"","msnumber":"","nonDraftVersions":[{"code":1,"date":"2025-05-13 03:14:17","doi":"10.21203/rs.3.rs-6635303/v1","editorialEvents":[{"type":"communityComments","content":0}],"status":"published","journal":{"display":true,"email":"[email protected]","identity":"researchsquare","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":true,"externalIdentity":"","sideBox":"","snPcode":"","submissionUrl":"/submission","title":"Research Square","twitterHandle":"researchsquare","acdcEnabled":true,"dfaEnabled":false,"editorialSystem":"","reportingPortfolio":"","inReviewEnabled":false,"inReviewRevisionsEnabled":true}}],"origin":"","ownerIdentity":"85f517a6-bf4e-4380-a16c-1f8c02b03ee5","owner":[],"postedDate":"May 13th, 2025","published":true,"recentEditorialEvents":[],"rejectedJournal":[],"revision":"","amendment":"","status":"posted","subjectAreas":[{"id":48434229,"name":"Soft Condensed-matter Physics"}],"tags":[],"updatedAt":"2025-05-13T03:14:17+00:00","versionOfRecord":[],"versionCreatedAt":"2025-05-13 03:14:17","video":"","vorDoi":"","vorDoiUrl":"","workflowStages":[]},"version":"v1","identity":"rs-6635303","journalConfig":"researchsquare"},"__N_SSP":true},"page":"/article/[identity]/[[...version]]","query":{"redirect":"/article/rs-6635303","identity":"rs-6635303","version":["v1"]},"buildId":"8U1c8b4HqxoKbykW_rLl7","isFallback":false,"isExperimentalCompile":false,"dynamicIds":[84888],"gssp":true,"scriptLoader":[]}

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