Yttrium Doped TiO2 Thin Film for Gas Sensing Application Prepared by Spin Coating Method | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article Yttrium Doped TiO2 Thin Film for Gas Sensing Application Prepared by Spin Coating Method M Abdul Kaiyum, Naim Ahmed, Arif Alam, M Shamimur Rahman This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-106302/v1 This work is licensed under a CC BY 4.0 License Status: Posted Version 1 posted You are reading this latest preprint version Abstract Yttrium (Y) doped and pure Titanium Di-oxide (TiO 2 ) thin films were prepared by using spin coater. The coater was set up in laboratory with low cost investment. The films were calcined at 450 °C for 1 hour. For characterization, Scanning Electron Microscopy (SEM), Energy Dispersive X-Ray Analysis (EDX), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Atomic Force Microscopy (AFM) were carried out. LCR Bridge - GW Instek LCR-821 was used for gas sensing applications. XPS showed that the change of electronic structure due to Y doping. SEM and AFM analysis were carried out to determine the surface morphology of the films. Yttrium (Y) decreased the crystallite size of the films and increased the surface roughness and porosity value, which was very good for many sensing applications. Gas sensing property of the deposited films were improved by the incorporation of yttrium impurities and the sensing property improved almost two times than pure TiO 2 thin film. Different researches have been done their research related to this topic but no one researchers provide a precise explanation of their results, authors of this research have tried to do that. Moreover the films were prepared by a simple spin coater to reduce the production cost also. Mechanical Engineering Ceramics thin film crystal structure surface roughness extrinsic impurities Figures Figure 1 Figure 1 Figure 2 Figure 2 Figure 3 Figure 3 Figure 4 Figure 4 Full Text Due to technical limitations, full-text HTML conversion of this manuscript could not be completed. However, the manuscript can be downloaded and accessed as a PDF. Supplementary Files Fig.S1HomemadeSpinCoater.PNG Fig.S1HomemadeSpinCoater.PNG Fig.S2grainSizeDistributions.jpg Fig.S2grainSizeDistributions.jpg Fig.S3XPSanalysis.PNG Fig.S3XPSanalysis.PNG Fig.S4EDSSpectra.PNG Fig.S4EDSSpectra.PNG Cite Share Download PDF Status: Posted Version 1 posted You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. Our growing team is made up of researchers and industry professionals working together to solve the most critical problems facing scientific publishing. Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-106302","acceptedTermsAndConditions":true,"allowDirectSubmit":true,"archivedVersions":[],"articleType":"Research Article","associatedPublications":[],"authors":[{"id":4621797,"identity":"b0897218-d281-4255-a08e-479a6eff8e1e","order_by":1,"name":"M Abdul Kaiyum","email":"data:image/png;base64,iVBORw0KGgoAAAANSUhEUgAAAZAAAAAyAQMAAABI0h/eAAAABlBMVEX///8AAABVwtN+AAAACXBIWXMAAA7EAAAOxAGVKw4bAAAA6ElEQVRIiWNgGAWjYBACCQbGBiBlgyLIxsBDWEsajG9AjBYwOEyCFsn2w23SvDnn7frbG9g+81T8YeBvP8D24A0eLdI8iUAt224nzzhzgHk2zxkDBokzCeyGc/BokWOAajGQSGBm5m0DOuwGA5s0PofJ8T8EaTmXbCD/AKjlnwGDPCEt0hJgWw7YGUgwALU0GDAYENIiOeNhs+XcbckJEmcSmxnnHDPmMTyT2I7XLxLn0x/eeLvNzp6//fBhhjc1cnJyxw8fwxtiQMACipvEBkicgmIEwsAHmD8ACXtCqkbBKBgFo2AEAwDWXUP1muXlgQAAAABJRU5ErkJggg==","orcid":"https://orcid.org/0000-0001-9160-304X","institution":"Rajshahi University of Engineering and Technology","correspondingAuthor":true,"prefix":"","firstName":"M","middleName":"Abdul","lastName":"Kaiyum","suffix":""},{"id":4621798,"identity":"39056286-f0a9-4690-8151-0bb02512231f","order_by":2,"name":"Naim Ahmed","email":"","orcid":"","institution":"Dept. of Glass \u0026 Ceramic Engineering (GCE)","correspondingAuthor":false,"prefix":"","firstName":"Naim","middleName":"","lastName":"Ahmed","suffix":""},{"id":4621799,"identity":"c5a8460d-95ef-4fd2-b965-5ea2f4d4400a","order_by":3,"name":"Arif Alam","email":"","orcid":"","institution":"Dept. of Glass \u0026 Ceramic Engineering (GCE)","correspondingAuthor":false,"prefix":"","firstName":"Arif","middleName":"","lastName":"Alam","suffix":""},{"id":4621800,"identity":"5c70c049-030d-4115-8e29-ee1edb21d4c5","order_by":4,"name":"M Shamimur Rahman","email":"","orcid":"","institution":"Dept. of Glass \u0026 Ceramic Engineering (GCE)","correspondingAuthor":false,"prefix":"","firstName":"M","middleName":"Shamimur","lastName":"Rahman","suffix":""}],"badges":[],"createdAt":"2020-11-11 12:40:06","currentVersionCode":1,"declarations":"","doi":"10.21203/rs.3.rs-106302/v1","doiUrl":"https://doi.org/10.21203/rs.3.rs-106302/v1","draftVersion":[],"editorialEvents":[],"editorialNote":"","failedWorkflow":false,"files":[{"id":3678080,"identity":"eb6af778-7ad3-41ee-a028-500913e6344a","added_by":"auto","created_at":"2020-11-18 21:24:07","extension":"png","order_by":1,"title":"Figure 1","display":"","copyAsset":false,"role":"figure","size":22672,"visible":true,"origin":"","legend":"X-ray diffraction patterns of pure and Y:TiO2 thin films ","description":"","filename":"floatimage1.png","url":"https://assets-eu.researchsquare.com/files/rs-106302/v1/8011267db85d427b218a5aa9.png"},{"id":3678070,"identity":"cb01f0b9-ab08-4e61-b404-5602c25b60f1","added_by":"auto","created_at":"2020-11-18 21:24:01","extension":"png","order_by":1,"title":"Figure 1","display":"","copyAsset":false,"role":"figure","size":22672,"visible":true,"origin":"","legend":"X-ray diffraction patterns of pure and Y:TiO2 thin films ","description":"","filename":"floatimage1.png","url":"https://assets-eu.researchsquare.com/files/rs-106302/v1/605bdaa0d931884d429633a7.png"},{"id":3678081,"identity":"b1b340eb-bbfd-491c-901b-bbd20ba5c452","added_by":"auto","created_at":"2020-11-18 21:24:07","extension":"jpg","order_by":2,"title":"Figure 2","display":"","copyAsset":false,"role":"figure","size":154747,"visible":true,"origin":"","legend":"SEM images of TiO2 thin films, (a) Pure TiO2; (b) 1%Y:TiO2; (c) 2%Y:TiO2; (d) 3%Y:TiO2. 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However, \nthe manuscript can be downloaded and accessed as a PDF.\u003c/p\u003e"}],"fulltextSource":"","fullText":"","funders":[],"hasAdminPriorityOnWorkflow":false,"hasManuscriptDocX":false,"hasOptedInToPreprint":true,"hasPassedJournalQc":"","hasAnyPriority":false,"hideJournal":true,"highlight":"","institution":"","isAcceptedByJournal":false,"isAuthorSuppliedPdf":true,"isDeskRejected":"","isHiddenFromSearch":false,"isInQc":false,"isInWorkflow":false,"isPdf":false,"isPdfUpToDate":true,"isWithdrawnOrRetracted":false,"journal":{"display":true,"email":"
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