Surface Morphology and Electrical Conductivity of In2S3 thin films Doped with Copper

In the present work, the electrical properties and morphology of In 2 S 3 thin films have been investigated. Also, the results have been carried out for In 2 S 3 thin films doped with Cu. The effect of variation the temperature has been studied on the morphology of In 2 S 3 thin films by using the AFM images. Thin films conductivity has been strongly influenced by Cu doping content, and temperature changing. Also, the electrical properties of these samples have been considered. Also, these properties have been analyzed for In 2 S 3 thin films doped with Cu at the specific temperature. The results show that In 2 S 3 thin films at lowest temperature has the maximum scattering component of transmission probability. Also, effect of different values of Cu () which has been doped in In 2 S 3 thin films have been studied, as it increased, the transmission probability and current density of these thin films have been increased.