Numerical Optimization of Neon Soft X-ray Emission in a Spherical Plasma Focus Device with Lee Code

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Abstract A comprehensive numerical investigation was performed to optimize neon (Ne) soft X-ray emission (Ysxr) from a spherical plasma focus (SPF) device using the latest Lee code. As a prerequisite for predictive modeling, the code was benchmarked against the experimentally measured discharge current waveform of the 135 kJ SPF [1]. In this numerical study using the Lee code (RADPF5.16FIB), the computed current trace is first fitted to the measured one at 14.3 Torr deuterium (D2) gas and the obtained best-fitted values of the model parameters are found as . These values were then adopted in a systematic optimisation study of the pinch-plasma conditions. The simulations covered Ne fill pressures from 0.5 to 7 Torr, anode and cathode radii at fixed ratios of and , and charging voltages from 15 to 30 kV. In all the cases, the plasma pinch temperature was constrained to the characteristic neon emission window of 2.3 × 106 – 5 × 106 K (≈ 200–500 eV). For each electrode geometry the Lee code identified a unique combination of fill pressure and charging voltage that maximized Ysxr. At moderate electrode sizes and bank voltages of 25 kV the SPF is predicted to deliver peak Ne soft X-ray (SXR) yields exceeding 5 kJ per shot with efficiencies greater than 4%. These findings demonstrate that the Lee model code, when calibrated to measured current traces, provides a robust and quantitative tool for the design and scaling of compact, high-performance Ne SXR sources.
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Numerical Optimization of Neon Soft X-ray Emission in a Spherical Plasma Focus Device with Lee Code | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article Numerical Optimization of Neon Soft X-ray Emission in a Spherical Plasma Focus Device with Lee Code M I Nayeem, M A Malek This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-8592689/v1 This work is licensed under a CC BY 4.0 License Status: Under Review Version 1 posted 6 You are reading this latest preprint version Abstract A comprehensive numerical investigation was performed to optimize neon (Ne) soft X-ray emission (Ysxr) from a spherical plasma focus (SPF) device using the latest Lee code. As a prerequisite for predictive modeling, the code was benchmarked against the experimentally measured discharge current waveform of the 135 kJ SPF [1]. In this numerical study using the Lee code (RADPF5.16FIB), the computed current trace is first fitted to the measured one at 14.3 Torr deuterium (D2) gas and the obtained best-fitted values of the model parameters are found as . These values were then adopted in a systematic optimisation study of the pinch-plasma conditions. The simulations covered Ne fill pressures from 0.5 to 7 Torr, anode and cathode radii at fixed ratios of and , and charging voltages from 15 to 30 kV. In all the cases, the plasma pinch temperature was constrained to the characteristic neon emission window of 2.3 × 106 – 5 × 106 K (≈ 200–500 eV). For each electrode geometry the Lee code identified a unique combination of fill pressure and charging voltage that maximized Ysxr. At moderate electrode sizes and bank voltages of 25 kV the SPF is predicted to deliver peak Ne soft X-ray (SXR) yields exceeding 5 kJ per shot with efficiencies greater than 4%. These findings demonstrate that the Lee model code, when calibrated to measured current traces, provides a robust and quantitative tool for the design and scaling of compact, high-performance Ne SXR sources. SPF Current trace fitting Ne SXR Electrode geometry Lee code Full Text Additional Declarations No competing interests reported. Cite Share Download PDF Status: Under Review Version 1 posted Reviewers agreed at journal 11 May, 2026 Reviewers agreed at journal 29 Jan, 2026 Reviewers invited by journal 16 Jan, 2026 Editor assigned by journal 15 Jan, 2026 Submission checks completed at journal 13 Jan, 2026 First submitted to journal 13 Jan, 2026 You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. Our growing team is made up of researchers and industry professionals working together to solve the most critical problems facing scientific publishing. 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