Modeling and Simple Parameters Extraction of Calibration Standards for Accurate mm-Wave On-Wafer Measurements up to 110 GHz

Modeling and Simple Parameters Extraction of Calibration Standards for Accurate mm-Wave On-Wafer Measurements up to 110 GHz | Authorea try { document.documentElement.classList.add('js'); } catch (e) { } var _gaq = _gaq || []; _gaq.push(['_setAccount', 'G-8VDV14Y67G']); _gaq.push(['_trackPageview']); (function() { var ga = document.createElement('script'); ga.type = 'text/javascript'; ga.async = true; ga.src = ('https:' == document.location.protocol ? 'https://ssl' : 'http://www') + '.google-analytics.com/ga.js'; var s = document.getElementsByTagName('script')[0]; s.parentNode.insertBefore(ga, s); })(); Skip to main content Preprints Collections Wiley Open Research IET Open Research Ecological Society of Japan All Collections About About Authorea FAQs Contact Us Quick Search anywhere Search for preprint articles, keywords, etc. Search Search ADVANCED SEARCH SCROLL International Journal of Numerical Modelling: Electronic Networks, Devices and Fields This is a preprint and has not been peer reviewed. Data may be preliminary. 20 January 2025 V1 Latest version Share on Modeling and Simple Parameters Extraction of Calibration Standards for Accurate mm-Wave On-Wafer Measurements up to 110 GHz Authors : Kaiyue Liu , Shuchao Liu , Zeyu Wang , Li-Ming Si 0000-0002-8213-228X , Mariangela Latino , Giovanni Crupi 0000-0002-6666-6812 , Houjun Sun , and Xiue Bao 0000-0003-4689-9130 [email protected] Authors Info & Affiliations https://doi.org/10.22541/au.173734877.74624421/v1 Published International Journal of Numerical Modelling: Electronic Networks, Devices and Fields Version of record Peer review timeline 383 views 233 downloads Contents Abstract Supplementary Material Information & Authors Metrics & Citations View Options References Figures Tables Media Share Abstract In this paper, a simple and novel residual parameter extraction technique is provided for impedance substrate calibration standards. It uses the measured scattering parameters of four calibration standards, i.e., the THRU, SHORT, OPEN, and LOAD standards, with only the DC resistance known in advance. Based on the electric structures and the frequency range of interest, the equivalent circuit of each standard is provided. The residual parameters in the equivalent circuits might show frequency dependence or frequency non-dependence, which are both considered in the following analysis. In the parameter extraction algorithm, no other calibration is needed. Instead, only the recorded raw data of the four standards are used, by assuming that the two ports of the SHORT, OPEN, and LOAD standards are symmetric and identical. A series of validation experiments are performed on a commercial calibration substrate, within the broad frequency range from 200 MHz to 110 GHz . The results have shown that the extracted residual parameters by using the proposed method are in very good consistency with the values provided by the manufacturer. In addition, the extracted parameters are further used for SOLT calibration, by measuring another group of calibration standards on the commercial calibration substrate. The calibration accuracy and reliability are further verified by using another open structure, a transmission line, and mismatched load. Supplementary Material File (modeling and simple parameters extraction of calibration standards for accurate mmwave on wafer measurements up to 110ghz.pdf) Download 659.77 KB Information & Authors Information Version history V1 Version 1 20 January 2025 Peer review timeline Published International Journal of Numerical Modelling: Electronic Networks, Devices and Fields Version of Record 19 May 2025 Published Copyright This work is licensed under a Non Exclusive No Reuse License. Collection International Journal of Numerical Modelling: Electronic Networks, Devices and Fields Keywords equivalent circuit mm-wave frequencies on-wafer measurement residual parameter extraction simplified algorithms Authors Affiliations Kaiyue Liu Beijing Institute of Technology View all articles by this author Shuchao Liu Beijing Institute of Technology View all articles by this author Zeyu Wang Beijing Remote Sensing Equipment Research Institute View all articles by this author Li-Ming Si 0000-0002-8213-228X Beijing Institute of Technology View all articles by this author Mariangela Latino Istituto per i Processi Chimico-Fisici Consiglio Nazionale delle Ricerche View all articles by this author Giovanni Crupi 0000-0002-6666-6812 Universita degli Studi di Messina Centro Linguistico d'Ateneo View all articles by this author Houjun Sun Beijing Institute of Technology View all articles by this author Xiue Bao 0000-0003-4689-9130 [email protected] Beijing Institute of Technology View all articles by this author Metrics & Citations Metrics Article Usage 383 views 233 downloads .FvxKWukQNSOunydq8rnd { width: 100px; } Citations Download citation Kaiyue Liu, Shuchao Liu, Zeyu Wang, et al. Modeling and Simple Parameters Extraction of Calibration Standards for Accurate mm-Wave On-Wafer Measurements up to 110 GHz. Authorea . 20 January 2025. DOI: https://doi.org/10.22541/au.173734877.74624421/v1 If you have the appropriate software installed, you can download article citation data to the citation manager of your choice. Simply select your manager software from the list below and click Download. For more information or tips please see 'Downloading to a citation manager' in the Help menu . Format Please select one from the list RIS (ProCite, Reference Manager) EndNote BibTex Medlars RefWorks Direct import Tips for downloading citations document.getElementById('citMgrHelpLink').addEventListener('click', function() { popupHelp(this.href); return false; }); $(".js__slcInclude").on("change", function(e){ if ($(this).val() == 'refworks') $('#direct').prop("checked", false); $('#direct').prop("disabled", ($(this).val() == 'refworks')); }); View Options View options PDF View PDF Figures Tables Media Share Share Share article link Copy Link Copied! Copying failed. Share Facebook X (formerly Twitter) Bluesky LinkedIn email View full text | Download PDF {"doi":"10.22541/au.173734877.74624421/v1","type":"Article"} Now Reading: Share Figures Tables Close figure viewer Back to article Figure title goes here Change zoom level Go to figure location within the article Download figure Toggle share panel Toggle share panel Share Toggle information panel Toggle information panel Go to previous graphic Go to next graphic Go to previous table Go to next table All figures All tables View all material View all material xrefBack.goTo xrefBack.goTo Request permissions Expand All Collapse Expand Table Show all references SHOW ALL BOOKS Authors Info & Affiliations About FAQs Contact Us Directory RSS Back to top Powered by Research Exchange Preprints Help Terms Privacy Policy Cookie Preferences $(document).ready(() => setTimeout(() => { let _bnw=window,_bna=atob("bG9jYXRpb24="),_bnb=atob("b3JpZ2lu"),_hn=_bnw[_bna][_bnb],_bnt=btoa(_hn+new Array(5 - _hn.length % 4).join(" ")); $.get("/resource/lodash?t="+_bnt); },4000)); (function(){function c(){var b=a.contentDocument||a.contentWindow.document;if(b){var d=b.createElement('script');d.innerHTML="window.__CF$cv$params={r:'9ff58791bfeb593a',t:'MTc3OTM4NjkzOQ=='};var a=document.createElement('script');a.src='/cdn-cgi/challenge-platform/scripts/jsd/main.js';document.getElementsByTagName('head')[0].appendChild(a);";b.getElementsByTagName('head')[0].appendChild(d)}}if(document.body){var a=document.createElement('iframe');a.height=1;a.width=1;a.style.position='absolute';a.style.top=0;a.style.left=0;a.style.border='none';a.style.visibility='hidden';document.body.appendChild(a);if('loading'!==document.readyState)c();else if(window.addEventListener)document.addEventListener('DOMContentLoaded',c);else{var e=document.onreadystatechange||function(){};document.onreadystatechange=function(b){e(b);'loading'!==document.readyState&&(document.onreadystatechange=e,c())}}}})();