Resolution Enhancement in Phase Microscopy: a Review

Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3-D topography in reflective samples as well as the inner structure or refractive index distribution of transparent and translucent samples. However, as in conventional optical microscopy, QPM provides either a large field of view (FOV) or a high resolution but not both. Many approaches such as oblique illumination, structured illumination and speckle illumination have been proposed to improve the spatial resolution of phase microscopy by restricting other degrees of freedom (mostly time). Therefore, the space bandwidth product (SBP) of QPM becomes enlarged. This paper aims to provide an up-to-date review on the resolution enhancement approaches of QPM, discussing the pros and cons of each technique as well as the confusion on resolution definition claim on QPM and other coherent microscopy.