Mid-level data fusion combined with the fingerprint region in near-infrared and Fourier transform mid-infrared spectroscopy for classification DON levels defect of Fusarium head blight wheat

Abstract In this study, a method of mid-level data fusion with the fingerprint region was proposed, which was combined with the characteristic wavelengths that contain fingerprint information in NIR and FT-MIR spectra to detect the DON level in FHB wheat during wheat processing. NIR and FT-MIR raw spectroscopy data on normal wheat and FHB wheat were obtained in the experiment. MSC was used for pretreatment, and characteristic wavelengths were extracted by CARS, MGS and XLW. The variables that can effectively reflect fingerprint information were retained to build the mid-level data fusion matrix. LS-SVM and PLS-DA were applied to investigate the performance of the single spectroscopic model, mid-level data fusion model and mid-level data fusion with fingerprint information model, respectively. Experimental results show that mid-level data fusion with a fingerprint information strategy based on fused NIR and FT-MIR spectra represents an effective method for the classification of DON levels in FHB wheat samples.