MEMS-scanning-based image projection simulation

The absence of simulation tools to predict image quality significantly complicates the hardware and software development of MEMS scanning-based projection systems. In this work, we present a mathematical and simulational framework to accurately predict the quality of images projected by MEMS-based point-scanning projection systems. The described framework is applied to visualize different kinds of distortions limiting the image quality of scanning-based projection systems. The simulation of beam propagation through the system enables entirely correcting all distortions in the projected image. Finally, simulation results are compared to images projected using a custom-made MEMS scanning-based projection system. The presented results demonstrate the potential of adequate simulation tools for system hardware and software optimization. The presented simulation framework can lay the foundation for systematic studies of scanning-based image formation and the optimization of perceived image quality.