Influence of Ar Gas Pressure On The Structural And Optical Properties And Surface Topography of Al-Doped ZnO Thin Films Sputtered By DC-Magnetron Sputtering Method

Influence of Ar Gas Pressure On The Structural And Optical Properties And Surface Topography of Al-Doped ZnO Thin Films Sputtered By DC-Magnetron Sputtering Method | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article Influence of Ar Gas Pressure On The Structural And Optical Properties And Surface Topography of Al-Doped ZnO Thin Films Sputtered By DC-Magnetron Sputtering Method Mahdiyeh Shiravand, Nader Ghobadi, Ebrahim Gholami Hatam This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-691578/v1 This work is licensed under a CC BY 4.0 License Status: Under Review Version 1 posted 6 You are reading this latest preprint version Abstract In this work, Aluminum doped Zinc oxide thin films were sputtered on glass substrate by the direct current (DC) magnetron sputtering method. The influence of Ar gas pressure on the structural and optical properties was measured. The optical parameters were calculated by UV- Visible spectroscopy, the nature of transition reveals direct allowed transition for the prepared films. Also, some physical quantities such as the strength of electron-phonon interaction, dissipation factor (tanδ) in the visible region and the lattice dielectric constant were presented for these thin films. The AFM analysis extracts surface parameters of the AZO thin films that help us to investigate the surface analysis with numerical data. The band gap energy and transition index without any presumption about transition natural were calculated from Derivation Ineffective Thickness Method (DITM) and the reaction of Ar gas pressure plays an essential part in controlling the physical quantities of AZO thin films. Atomic and Molecular Physics Optical Materials and Devices AL doped ZnO Transition index Urbach tail Refractive index dielectric constant dissipation factor (DITM) the strength of electron-phonon interaction the lattice dielectric constant. Full Text Cite Share Download PDF Status: Under Review Version 1 posted Editorial decision: Major revisions 10 May, 2022 Reviews received at journal 21 Apr, 2022 Reviewers invited by journal 11 Sep, 2021 Editor invited by journal 11 Jul, 2021 Editor assigned by journal 10 Jul, 2021 First submitted to journal 05 Jul, 2021 You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. 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Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-691578","acceptedTermsAndConditions":true,"allowDirectSubmit":false,"archivedVersions":[],"articleType":"Research Article","associatedPublications":[],"authors":[{"id":51527609,"identity":"af44e3b7-e959-46af-9f1e-72f9e2282a5e","order_by":0,"name":"Mahdiyeh Shiravand","email":"","orcid":"","institution":"University of Malayer","correspondingAuthor":false,"prefix":"","firstName":"Mahdiyeh","middleName":"","lastName":"Shiravand","suffix":""},{"id":51527608,"identity":"2bac4208-f200-45d1-b98b-6db200fdc52f","order_by":1,"name":"Nader Ghobadi","email":"data:image/png;base64,iVBORw0KGgoAAAANSUhEUgAAAZAAAAAyAQMAAABI0h/eAAAABlBMVEX///8AAABVwtN+AAAACXBIWXMAAA7EAAAOxAGVKw4bAAABB0lEQVRIiWNgGAWjYHACNgbGBgbGNvYGBoYHCFEJIrTwHGBgSCBJS4NEAooW3MCcgf3ag4877GT7JF8nfkioOSxnPiOB8cMPBot8XFosG3jKDWeeSTZuk87dLJFw7LCxzI0EZskeBgnLBhxaDA7wpEnztjEnArVskEhgO5w4A+hCaaBfDHDZAtVSn9gmeXbzj4R/h+uBWph/49fCfgyo5XBimwTvNonEtsMJEkC78NtymIdNcuaZ48ZtPLnbLBL70g1n8Dxss+wxwKPlePsziY87qmXnt5/dfOPDN2t5Cfbkwzd+VNTh1MLAzIMi1wzEwGhiwK0BCNgfIPPq8CkdBaNgFIyCEQoA7WZTV+244mcAAAAASUVORK5CYII=","orcid":"https://orcid.org/0000-0002-9957-9395","institution":"University of Malayer","correspondingAuthor":true,"prefix":"","firstName":"Nader","middleName":"","lastName":"Ghobadi","suffix":""},{"id":51527610,"identity":"aece957d-87a2-4514-b094-374b53f58789","order_by":2,"name":"Ebrahim Gholami Hatam","email":"","orcid":"","institution":"University of Malayer","correspondingAuthor":false,"prefix":"","firstName":"Ebrahim","middleName":"Gholami","lastName":"Hatam","suffix":""}],"badges":[],"createdAt":"2021-07-07 03:04:27","currentVersionCode":1,"declarations":"","doi":"10.21203/rs.3.rs-691578/v1","doiUrl":"https://doi.org/10.21203/rs.3.rs-691578/v1","draftVersion":[],"editorialEvents":[],"editorialNote":"","failedWorkflow":false,"files":[{"id":13679050,"identity":"db0cb86f-8bf2-4dc2-81b3-80d490b6f6a3","added_by":"auto","created_at":"2021-09-17 11:41:57","extension":"pdf","order_by":1,"title":"","display":"","copyAsset":false,"role":"manuscript-pdf","size":1403256,"visible":true,"origin":"","legend":"","description":"","filename":"AZOarticlepressure.pdf","url":"https://assets-eu.researchsquare.com/files/rs-691578/v1_covered.pdf"},{"id":13372339,"identity":"84f28056-8ba6-4f54-b20c-f9992004e00d","added_by":"auto","created_at":"2021-09-14 17:42:44","extension":"pdf","order_by":1,"title":"","display":"","copyAsset":false,"role":"manuscript-pdf","size":1399784,"visible":true,"origin":"","legend":"","description":"","filename":"AZOarticlepressure.pdf","url":"https://assets-eu.researchsquare.com/files/rs-691578/v1_covered.pdf"}],"financialInterests":"","formattedTitle":"\u003cp\u003eInfluence of Ar Gas Pressure On The Structural And Optical Properties And Surface Topography of Al-Doped ZnO Thin Films Sputtered By DC-Magnetron Sputtering Method\u003c/p\u003e","fulltext":[{"header":"Full Text","content":"This preprint is available for \u003ca href='/article/rs-691578/latest.pdf' target='_blank'\u003edownload as a PDF\u003c/a\u003e."}],"fulltextSource":"","fullText":"","funders":[],"hasAdminPriorityOnWorkflow":false,"hasManuscriptDocX":false,"hasOptedInToPreprint":true,"hasPassedJournalQc":"","hasAnyPriority":false,"hideJournal":false,"highlight":"","institution":"","isAcceptedByJournal":true,"isAuthorSuppliedPdf":true,"isDeskRejected":"","isHiddenFromSearch":false,"isInQc":false,"isInWorkflow":true,"isPdf":false,"isPdfUpToDate":true,"isWithdrawnOrRetracted":false,"journal":{"display":true,"email":"[email protected]","identity":"optical-and-quantum-electronics","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":false,"externalIdentity":"oqel","sideBox":"Learn more about [Optical and Quantum Electronics](https://www.springer.com/journal/11082)","snPcode":"11082","submissionUrl":"https://submission.nature.com/new-submission/11082/3","title":"Optical and Quantum Electronics","twitterHandle":"","acdcEnabled":true,"dfaEnabled":true,"editorialSystem":"em","reportingPortfolio":"Springer Hybrid","inReviewEnabled":true,"inReviewRevisionsEnabled":false},"keywords":"AL doped ZnO, Transition index, Urbach tail, Refractive index, dielectric constant, dissipation factor, (DITM), the strength of electron-phonon interaction, the lattice dielectric constant.","lastPublishedDoi":"10.21203/rs.3.rs-691578/v1","lastPublishedDoiUrl":"https://doi.org/10.21203/rs.3.rs-691578/v1","license":{"name":"CC BY 4.0","url":"https://creativecommons.org/licenses/by/4.0/"},"manuscriptAbstract":"\u003cp\u003eIn this work, Aluminum doped Zinc oxide thin films were sputtered on glass substrate by the direct current (DC) magnetron sputtering method. 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