Accelerated Aging Effects on SRAM PUF reliability at various Temperature and Voltage conditions

Abstract This paper thoroughly investigates the trustworthiness of Static Random-Access Memory (SRAM) Physical Unclonable Functions (PUFs) within hardware security. It presents an overview of SRAM PUFs, their significance in hardware security, and their essential features. The paper explores the realms of evaluation metrics and practical examination of SRAM cell start-up values concerning an 8-bit SRAM dataset. Concurrently, it navigates the encountered challenges. A comprehensive pattern analysis of SRAM cell stability is discussed with accelerated aging. Compared the outputs at multiple trials to authenticate the result. The complex interplay of factors that affect the dependability of SRAM PUFs, encompassing environmental conditions, the accumulation of aging effects, and the complex landscape of process variations, is carefully explained and clarified. The paper concludes by summarizing key findings, emphasizing the importance of reliable hardware security, and suggesting future research directions for enhancing SRAM PUF reliability.