Photorefractive and pyroelectric photonic memory and long-term stability in thin- film lithium niobate microresonators

Photorefractive and pyroelectric photonic memory and long-term stability in thin- film lithium niobate microresonators | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Article Photorefractive and pyroelectric photonic memory and long-term stability in thin- film lithium niobate microresonators Xinyi Ren, Chun-Ho Lee, Kaiwen Xue, Shaoyuan Ou, Yue Yu, Zaijun Chen, and 1 more This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-5066867/v1 This work is licensed under a CC BY 4.0 License Status: Under Review Version 1 posted 12 You are reading this latest preprint version Abstract The stability of the integrated photonic circuits is of critical importance for many applications that require high frequency precision or robust operation over time, such as optomechanical sensing, frequency conversion, optical communication, and quantum optics. Photonic memory is useful for low-energy optical computing and interconnects. Thin film lithium niobate (TFLN), as an emerging photonic platform, exhibits complex material properties including pyroelectric (PE) and photorefractive (PR) effects which could lead to intra-device drift and excess noise under different environmental or operating conditions as well as be utilized for building photonic memory. However, the long-term stability and memory effect of its optical properties has not been explored. In this paper, we discovered a long-lived change of optical refractive index as a result of light excitation and temporal temperature variation using Z-cut TFLN microresonators and reveal a strong dependence of the instability with the crystal orientation of the thin film form. The recovery time are measured to be over 10 hours. Leveraging the photonic memory with a long relaxation time, we realize optical trimming of the cavity resonance frequencies. Our result offers insights towards understanding the fundamental noise properties and dynamic behavior of the integrated TFLN material and devices. Physical sciences/Nanoscience and technology Physical sciences/Optics and photonics lithium niobate integrated photonics photorefractive pyroelectric non-volatile memory Full Text Additional Declarations No competing interests reported. Supplementary Files SubmissionSupplementaryinformation.docx Cite Share Download PDF Status: Under Review Version 1 posted Editorial decision: Revision requested 28 Oct, 2024 Reviews received at journal 27 Oct, 2024 Reviews received at journal 10 Oct, 2024 Reviews received at journal 09 Oct, 2024 Reviewers agreed at journal 04 Oct, 2024 Reviewers agreed at journal 04 Oct, 2024 Reviewers agreed at journal 25 Sep, 2024 Reviewers agreed at journal 24 Sep, 2024 Reviewers invited by journal 24 Sep, 2024 Editor assigned by journal 24 Sep, 2024 Submission checks completed at journal 11 Sep, 2024 First submitted to journal 10 Sep, 2024 You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. 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Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-5066867","acceptedTermsAndConditions":true,"allowDirectSubmit":false,"archivedVersions":[],"articleType":"Article","associatedPublications":[],"authors":[{"id":371133069,"identity":"e1e47bf9-7983-4bb8-94f4-92b10dd04401","order_by":0,"name":"Xinyi Ren","email":"","orcid":"","institution":"University of Southern California","correspondingAuthor":false,"prefix":"","firstName":"Xinyi","middleName":"","lastName":"Ren","suffix":""},{"id":371133070,"identity":"3c34fccf-6bf0-49fc-921c-9694fe0d3b0c","order_by":1,"name":"Chun-Ho Lee","email":"","orcid":"","institution":"University of Southern 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