Reflectance Test Method of X-ray Optics on the 100-m X-ray Test Facility

Reflectance Test Method of X-ray Optics on the 100-m X-ray Test Facility | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article Reflectance Test Method of X-ray Optics on the 100-m X-ray Test Facility Yuxuan Zhu, Zijian Zhao, Dongjie Hou, Yanji Yang, Xiongtao Yang, and 8 more This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-4474985/v1 This work is licensed under a CC BY 4.0 License Status: Published Journal Publication published 01 Nov, 2024 Read the published version in Experimental Astronomy → Version 1 posted 7 You are reading this latest preprint version Abstract Reflectance is a key topic in soft X-ray optics research and serves as the foundation for the study of X-ray astronomical satellites and payload performance. Since its establishment, the 100-m X-ray Test Facility (100XF) has been continuously developing various testing functionalities, including calibration of timing, imaging, and energy response. This paper provides a detailed description of the X-ray optics reflectance test method based on the 100XF, which is applicable to various grazing incident X-ray optics, including Wolter-I and lobster-eye types, significantly expanding the application scope of the 100XF. A flat mirror sample (SiO 2 coated on Si wafer) are tested. Results of the variation of reflectivity with angle @ C-Kα (0.28 keV), Al-Kα(1.49 keV) and Ti-Kα(4.50 keV) are presented among the description. Additionally, reflectance test method has been applied to the coating reflectivity study of the enhanced X-ray Timing and Polarimetry Mission (eXTP) mirror. At the same time, a new method utilizing continuum spectrum of bremsstrahlung was carried out for studying the continuous variation of reflectivity with energy, greatly improving efficiency compared to traditional methods, and all the results show a good agreement with the theoretical values. The deviation between the test values and theoretical values in the low-energy range (1.5-8.0 keV) is less than 10%. X-ray astronomy X-ray optics the 100-m X-ray Test Facility Reflectance test Full Text Additional Declarations No competing interests reported. Cite Share Download PDF Status: Published Journal Publication published 01 Nov, 2024 Read the published version in Experimental Astronomy → Version 1 posted Editorial decision: Revision requested 07 Oct, 2024 Reviews received at journal 07 Oct, 2024 Reviewers agreed at journal 07 Sep, 2024 Reviewers invited by journal 23 Aug, 2024 Editor assigned by journal 04 Jun, 2024 Submission checks completed at journal 29 May, 2024 First submitted to journal 24 May, 2024 You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. 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Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-4474985","acceptedTermsAndConditions":true,"allowDirectSubmit":false,"archivedVersions":[],"articleType":"Research Article","associatedPublications":[],"authors":[{"id":312362858,"identity":"57b4a2d2-db09-4f6c-bf00-0f6c2ff9d663","order_by":0,"name":"Yuxuan Zhu","email":"","orcid":"","institution":"Institute of High Energy Physics, Chinese Academy of Sciences","correspondingAuthor":false,"prefix":"","firstName":"Yuxuan","middleName":"","lastName":"Zhu","suffix":""},{"id":312362859,"identity":"0812d7df-cdc8-4e9b-b287-094e8a39be9b","order_by":1,"name":"Zijian Zhao","email":"","orcid":"","institution":"Institute of High Energy Physics, 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