Failure Analysis of Beam Scanning system of High-power DC Industrial Electron Accelerator

Failure Analysis of Beam Scanning system of High-power DC Industrial Electron Accelerator | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article Failure Analysis of Beam Scanning system of High-power DC Industrial Electron Accelerator Kavita Pramod Dixit, Shreya Ghatak Sarkar, Vipul Garg, Sajal Kumar, and 3 more This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-3876834/v1 This work is licensed under a CC BY 4.0 License Status: Posted Version 1 posted You are reading this latest preprint version Abstract Reliable performance of high-power electron accelerators is a very important aspect, as the numerous industrial applications for which they are employed require 24 x 7 operation. For this purpose, it is necessary to understand the failures that occur in such accelerator systems and employ mitigation methods to ensure their availability. Beam scanning system, which helps to deliver a uniform dose to the products being irradiated under the electron beam, is a critical sub-system of in industrial accelerators. Failure Mode & Effects Analysis has been performed and it is identified that the titanium foil in beam scanning system is considered as weakest link affecting the availability of the system. This paper focuses on the beam scanning system of a 1 MeV DC Accelerator, to analyse the failure of a punctured titanium foil window, through which the beam emerges for irradiation. Analysis through SEM analysis and Raman spectroscopy have been conducted and results are discussed here. Mechanistic model for Ti grade 2 window has been developed and failure probability of the foil has been estimated. Using this estimation, Bayesian network has been developed, with operational data and expert judgement. Mitigation techniques are recommended to ensure the targeted availability of the accelerator. Failure analysis Beam scanning system High power DC Electron Accelerator Titanium foil Full Text Cite Share Download PDF Status: Posted Version 1 posted You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. Our growing team is made up of researchers and industry professionals working together to solve the most critical problems facing scientific publishing. Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-3876834","acceptedTermsAndConditions":true,"allowDirectSubmit":true,"archivedVersions":[],"articleType":"Research Article","associatedPublications":[],"authors":[{"id":311224766,"identity":"2d62ffe0-653d-4ee0-9e6a-8a00073681a6","order_by":0,"name":"Kavita Pramod 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