Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Article Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters Firozeh Kazemi, Maryam Mostajeran, Gennady Romanov This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-3324962/v1 This work is licensed under a CC BY 4.0 License Status: Published Journal Publication published 08 Jan, 2024 Read the published version in Scientific Reports → Version 1 posted 10 You are reading this latest preprint version Abstract The way multipacting develops, depends strongly on the secondary emission property of the surface material. The knowledge of secondary electron yield is crucial for accurate prediction of the multipacting threshold. Variations in secondary electron yield parameters from experimental measurements create uncertainty, stemming from handling and surface preparation, and these uncertainties significantly affect multipacting threshold predictions. Despite their significance, the previous studies on the multipacting phenomenon did not adequately address the effect of an assumed random distribution of the secondary emission parameters on the multipacting threshold. Therefore, this paper aims to provide a comprehensive statistical study on how the different random distributions of the secondary emission parameters and, as a result, the uncertainty in the secondary electron yield affect multipacting thresholds. We focus on three commonly used distributions, namely uniform, normal, and truncated normal distributions, to define the uncertainty of random inputs. We use the chaos polynomial expansion method to determine how much each of the random parameters contributes to the multipacting threshold uncertainty. Additionally, we calculate Sobol sensitivity indices to evaluate the impact of the individual parameters or groups of parameters on the model outputs and study how different random distributions of these parameters affected the Sobol index results. Physical sciences/Physics Physical sciences/Physics/Plasma physics Physical sciences/Mathematics and computing/Statistics Full Text Additional Declarations No competing interests reported. Cite Share Download PDF Status: Published Journal Publication published 08 Jan, 2024 Read the published version in Scientific Reports → Version 1 posted Editorial decision: Revision requested 13 Nov, 2023 Reviews received at journal 11 Nov, 2023 Reviewers agreed at journal 25 Oct, 2023 Reviews received at journal 12 Oct, 2023 Reviewers agreed at journal 25 Sep, 2023 Reviewers invited by journal 24 Sep, 2023 Editor assigned by journal 24 Sep, 2023 Editor invited by journal 07 Sep, 2023 Submission checks completed at journal 07 Sep, 2023 First submitted to journal 04 Sep, 2023 You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. 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Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-3324962","acceptedTermsAndConditions":true,"allowDirectSubmit":false,"archivedVersions":[],"articleType":"Article","associatedPublications":[],"authors":[{"id":231463864,"identity":"21a96796-d155-49b9-8316-aa9e0d80464d","order_by":0,"name":"Firozeh Kazemi","email":"","orcid":"","institution":"Yazd University","correspondingAuthor":false,"submittingAuthor":false,"prefix":"","firstName":"Firozeh","middleName":"","lastName":"Kazemi","suffix":""},{"id":231463866,"identity":"90afb154-fa23-4972-8cd5-8a45bcc6576a","order_by":1,"name":"Maryam Mostajeran","email":"data:image/png;base64,iVBORw0KGgoAAAANSUhEUgAAAZAAAAAyAQMAAABI0h/eAAAABlBMVEX///8AAABVwtN+AAAACXBIWXMAAA7EAAAOxAGVKw4bAAAA8klEQVRIiWNgGAWjYNACHhDBfABEgPkHCKhnbIBoYUsgRQvEKgO4FrxAt739+YMfMjb5/LN7vkn8+GPNwN9+gPFwBR4tZmfOGDb28KRZzrhzdptkD086g8SZBIaDZ/BpuZHD2MDDc9iA4UbuNgkeicMMDDcYGA424NWS/rDxD89/A/kbOc8k/xgcZpAnrCXBsJmH54CBwY0cNmmehMMMBgS1AP0yW4Yn2cDwRpqxtcyBdB7DM4kN+LUcb3/w8W2PnYHcjeSHN9/8sZaTO3748Ed8WsCAsQdMsUgwgBMCLKLwgh9gkvkDEUpHwSgYBaNgBAIAIPZReu0+NI8AAAAASUVORK5CYII=","orcid":"","institution":"Yazd University","correspondingAuthor":true,"submittingAuthor":false,"prefix":"","firstName":"Maryam","middleName":"","lastName":"Mostajeran","suffix":""},{"id":231463868,"identity":"80f1e88b-e531-43ef-be60-291f51a752b4","order_by":2,"name":"Gennady Romanov","email":"","orcid":"","institution":"Fermi National Accelerator Laboratory","correspondingAuthor":false,"submittingAuthor":false,"prefix":"","firstName":"Gennady","middleName":"","lastName":"Romanov","suffix":""}],"badges":[],"createdAt":"2023-09-04 15:14:18","currentVersionCode":1,"declarations":"","doi":"10.21203/rs.3.rs-3324962/v1","doiUrl":"https://doi.org/10.21203/rs.3.rs-3324962/v1","draftVersion":[],"editorialEvents":[{"content":"https://doi.org/10.1038/s41598-024-51289-z","type":"published","date":"2024-01-08T15:01:46+00:00"}],"editorialNote":"","failedWorkflow":false,"files":[{"id":49628681,"identity":"f4fc8d03-6e5a-4064-8a30-49d68410152d","added_by":"auto","created_at":"2024-01-15 15:08:54","extension":"pdf","order_by":1,"title":"","display":"","copyAsset":false,"role":"manuscript-pdf","size":859682,"visible":true,"origin":"","legend":"","description":"","filename":"manuscriptNEW.pdf","url":"https://assets-eu.researchsquare.com/files/rs-3324962/v1_covered_3de59d77-63d7-43c0-a397-428140d353b8.pdf"}],"financialInterests":"No competing interests reported.","formattedTitle":"Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters","fulltext":[],"fulltextSource":"","fullText":"","funders":[],"hasAdminPriorityOnWorkflow":false,"hasManuscriptDocX":false,"hasOptedInToPreprint":true,"hasPassedJournalQc":"","hasAnyPriority":false,"hideJournal":false,"highlight":"","institution":"","isAcceptedByJournal":true,"isAuthorSuppliedPdf":true,"isDeskRejected":"","isHiddenFromSearch":false,"isInQc":false,"isInWorkflow":false,"isPdf":true,"isPdfUpToDate":true,"isWithdrawnOrRetracted":false,"journal":{"display":true,"email":"[email protected]","identity":"scientific-reports","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":false,"externalIdentity":"scirep","sideBox":"Learn more about [Scientific Reports](http://www.nature.com/srep/)","snPcode":"","submissionUrl":"","title":"Scientific Reports","twitterHandle":"","acdcEnabled":true,"dfaEnabled":true,"editorialSystem":"stoa","reportingPortfolio":"Scientific Reports","inReviewEnabled":true,"inReviewRevisionsEnabled":true},"keywords":"","lastPublishedDoi":"10.21203/rs.3.rs-3324962/v1","lastPublishedDoiUrl":"https://doi.org/10.21203/rs.3.rs-3324962/v1","license":{"name":"CC BY 4.0","url":"https://creativecommons.org/licenses/by/4.0/"},"manuscriptAbstract":"\u003cp\u003eThe way multipacting develops, depends strongly on the secondary emission property of the surface material. 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