Test Development for Power Management Integrated Circuit

Integrated circuits are the basic building blocks of almost all commercial electronic devices, such as workstations, mobile phones, personal computers, automation hardware, automobiles, modern gear, military hardware, and home appliances. A single IC defect can cause the entire system to fail. Every IC must meet the technical specifications defined in the database during the IC manufacturing process. Unfortunately, a small number of ICs fail to meet the required standards sometimes. These faults must be identified prior to the product has been released to the market. As a result, testing necessitates the development of a test environment, an integration of hardware and software that ensures the quality of the product comparable to that of any other. The purpose of the project is to create a test solution for the Smart High Side Switch which is a Power Management IC. Test program for the device is developed such that it verifies all the specifications as mentioned in the database. Characterization of the device is also performed to statistically analyze the quality and life span of the device. The testing is done on Eagle Test Systems(ETS) ATE and verified all specifications.