The effect of copper doping on the structural, optical, and electrical properties of cadmium oxide thin films using the spray pyrolysis technique

The effect of copper doping on the structural, optical, and electrical properties of cadmium oxide thin films using the spray pyrolysis technique | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article The effect of copper doping on the structural, optical, and electrical properties of cadmium oxide thin films using the spray pyrolysis technique Fatemeh Davari, Mohammad Reza Fadavieslam This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-216115/v1 This work is licensed under a CC BY 4.0 License Status: Posted Version 1 posted You are reading this latest preprint version Abstract In this study, the pure and Cu doped CdO thin films with various doping concentrations (0 to 5 at.%) were deposited on soda-lime glass substrates, using the chemical spray pyrolysis technique. The effects of Cu doping on the structural, optical, and electrical properties of thin films were, then, investigated. The films were characterized through X-ray diffraction (XRD), field emission scanning electron microscopy equipped with an energy dispersive x-ray analyzer (FESEM-EDX), atomic force microscopy (AFM), ultraviolet-visible spectroscopy, and electrical resistance; van der Pauw techniques were also used to measure the Hall effect. X-ray diffraction studies showed that the thin films were polycrystalline only with cadmium oxide phase with the cubic face-centered crystal structure and the preferred orientations were along (111), (200), (220), (311), and (311) planes. The FE-SEM and AFM images also showed that with an increase in Cu doping levels, the grain size and surface roughness of the thin films decreased from 472 to 38 nm and from 163 to 54 nm, respectively. The expected element compositions were confirmed by EDX. The optical bandgap of the thin films ranged from 2.42 to 2.56 eV, and as Cu dopant increased, so, too, the optical bandgap. As the Cu doping concentration increased from 0 to 5 (at.%), the electrical resistivity and Seebeck coefficient were found to increase from 3.74⋅10 − 4 to 8.77⋅10 − 3 Ω.cm and 8.28⋅10 − 6 to 2.52⋅10 − 5 v/k (at 100 C o temperature difference), respectively; the carrier concentration and carrier mobility were also found to decrease from 3.24⋅10 20 to 1.76⋅10 20 cm − 3 and from 55.5 to 4.05 cm 2 /v.s, respectively. The Hall effect and thermoelectric studies revealed that the films exhibited an n-type conductivity. Optical Materials and Devices Electronic Materials and Devices Soda-lime Glass Substrates Grain Size Surface Roughness Electrical Resistivity Seebeck Coefficient Carrier Concentration and Mobility n-type Conductivity Figures Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 Figure 10 Figure 11 Full Text Due to technical limitations, full-text HTML conversion of this manuscript could not be completed. However, the latest manuscript can be downloaded and accessed as a PDF. Cite Share Download PDF Status: Posted Version 1 posted You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. Our growing team is made up of researchers and industry professionals working together to solve the most critical problems facing scientific publishing. Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {"props":{"pageProps":{"initialData":{"identity":"rs-216115","acceptedTermsAndConditions":true,"allowDirectSubmit":true,"archivedVersions":[],"articleType":"Research Article","associatedPublications":[],"authors":[{"id":12959264,"identity":"90eb3e5c-865e-4e90-872e-8fb346e73241","order_by":0,"name":"Fatemeh Davari","email":"","orcid":"","institution":"Damghan University","correspondingAuthor":false,"submittingAuthor":false,"prefix":"","firstName":"Fatemeh","middleName":"","lastName":"Davari","suffix":""},{"id":12959265,"identity":"256292ed-feeb-40d5-bec6-3ae9a4cdaf81","order_by":1,"name":"Mohammad Reza Fadavieslam","email":"data:image/png;base64,iVBORw0KGgoAAAANSUhEUgAAAZAAAAAyAQMAAABI0h/eAAAABlBMVEX///8AAABVwtN+AAAACXBIWXMAAA7EAAAOxAGVKw4bAAABAElEQVRIie3RsUoDMRzH8d8RiEu1a0SwTyCkCIeliK/yPwreVFw7FDkoZCrX+d6ik3NKoLf0AQ6ynPgCAaEUhOLV4iLkqptDvmT6w4d/QoBQ6L82AcPhoAauob9mop1svgkBt38gOJIk0yfudJOd19DTYU+WzDiavqR5RZHb4e7JR2J9JqHXaX9p+KOgtR0XFbHLOcQg8xIO5riJilknBnE7XlaEq+Yt0r+FA3pvHopZ993R3qay2fJxkqyUSRasA5EoSw3h7VsMh17l6WjBeCyS3PaLzasazGULKVVU6+3wXnXNm3Nb27soR6baTZ695PAj+scoygA/CIVCodAv+gSQb1aEZSNzIQAAAABJRU5ErkJggg==","orcid":"https://orcid.org/0000-0003-3981-8697","institution":"Damghan University","correspondingAuthor":true,"submittingAuthor":false,"prefix":"","firstName":"Mohammad","middleName":"Reza","lastName":"Fadavieslam","suffix":""}],"badges":[],"createdAt":"2021-02-07 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However, the latest manuscript can be downloaded and \u003ca href='/article/rs-216115/latest.pdf' target='_blank'\u003e accessed as a PDF.\u003c/a\u003e"}],"fulltextSource":"","fullText":"","funders":[],"hasAdminPriorityOnWorkflow":false,"hasManuscriptDocX":false,"hasOptedInToPreprint":true,"hasPassedJournalQc":"","hasAnyPriority":false,"hideJournal":true,"highlight":"","institution":"","isAcceptedByJournal":false,"isAuthorSuppliedPdf":true,"isDeskRejected":"","isHiddenFromSearch":false,"isInQc":false,"isInWorkflow":false,"isPdf":false,"isPdfUpToDate":true,"isWithdrawnOrRetracted":false,"journal":{"display":true,"email":"[email protected]","identity":"researchsquare","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":true,"externalIdentity":"","sideBox":"","snPcode":"","submissionUrl":"/submission","title":"Research Square","twitterHandle":"researchsquare","acdcEnabled":true,"dfaEnabled":false,"editorialSystem":"","reportingPortfolio":"","inReviewEnabled":false,"inReviewRevisionsEnabled":true},"keywords":"Soda-lime Glass Substrates, Grain Size, Surface Roughness, Electrical Resistivity, Seebeck Coefficient, Carrier Concentration and Mobility, n-type Conductivity","lastPublishedDoi":"10.21203/rs.3.rs-216115/v1","lastPublishedDoiUrl":"https://doi.org/10.21203/rs.3.rs-216115/v1","license":{"name":"CC BY 4.0","url":"https://creativecommons.org/licenses/by/4.0/"},"manuscriptAbstract":"\u003cp\u003eIn this study, the pure and Cu doped CdO thin films with various doping concentrations (0 to 5 at.%) were deposited on soda-lime glass substrates, using the chemical spray pyrolysis technique. The effects of Cu doping on the structural, optical, and electrical properties of thin films were, then, investigated. The films were characterized through X-ray diffraction (XRD), field emission scanning electron microscopy equipped with an energy dispersive x-ray analyzer (FESEM-EDX), atomic force microscopy (AFM), ultraviolet-visible spectroscopy, and electrical resistance; van der Pauw techniques were also used to measure the Hall effect. X-ray diffraction studies showed that the thin films were polycrystalline only with cadmium oxide phase with the cubic face-centered crystal structure and the preferred orientations were along (111), (200), (220), (311), and (311) planes. The FE-SEM and AFM images also showed that with an increase in Cu doping levels, the grain size and surface roughness of the thin films decreased from 472 to 38 nm and from 163 to 54 nm, respectively. The expected element compositions were confirmed by EDX. The optical bandgap of the thin films ranged from 2.42 to 2.56 eV, and as Cu dopant increased, so, too, the optical bandgap. As the Cu doping concentration increased from 0 to 5 (at.%), the electrical resistivity and Seebeck coefficient were found to increase from 3.74\u0026sdot;10\u003csup\u003e\u0026minus;\u0026thinsp;4\u003c/sup\u003e to 8.77\u0026sdot;10\u003csup\u003e\u0026minus;\u0026thinsp;3\u003c/sup\u003e Ω.cm and 8.28\u0026sdot;10\u003csup\u003e\u0026minus;\u0026thinsp;6\u003c/sup\u003e to 2.52\u0026sdot;10\u003csup\u003e\u0026minus;\u0026thinsp;5\u003c/sup\u003e v/k (at 100 C\u003csup\u003eo\u003c/sup\u003e temperature difference), respectively; the carrier concentration and carrier mobility were also found to decrease from 3.24\u0026sdot;10\u003csup\u003e20\u003c/sup\u003e to 1.76\u0026sdot;10\u003csup\u003e20\u003c/sup\u003e cm\u003csup\u003e\u0026minus;\u0026thinsp;3\u003c/sup\u003e and from 55.5 to 4.05 cm\u003csup\u003e2\u003c/sup\u003e/v.s, respectively. The Hall effect and thermoelectric studies revealed that the films exhibited an n-type conductivity.\u003c/p\u003e","manuscriptTitle":"The effect of copper doping on the structural, optical, and electrical properties of cadmium oxide thin films using the spray pyrolysis technique","msid":"","msnumber":"","nonDraftVersions":[{"code":1,"date":"2021-02-23 20:10:55","doi":"10.21203/rs.3.rs-216115/v1","editorialEvents":[{"type":"communityComments","content":0}],"status":"published","journal":{"display":true,"email":"[email protected]","identity":"researchsquare","isNatureJournal":false,"hasQc":true,"allowDirectSubmit":true,"externalIdentity":"","sideBox":"","snPcode":"","submissionUrl":"/submission","title":"Research Square","twitterHandle":"researchsquare","acdcEnabled":true,"dfaEnabled":false,"editorialSystem":"","reportingPortfolio":"","inReviewEnabled":false,"inReviewRevisionsEnabled":true}}],"origin":"","ownerIdentity":"53328992-8fb2-494d-981d-e2eb0f77df06","owner":[],"postedDate":"February 23rd, 2021","published":true,"recentEditorialEvents":[],"rejectedJournal":[],"revision":"","amendment":"","status":"posted","subjectAreas":[{"id":2584952,"name":"Optical Materials and Devices"},{"id":2584953,"name":"Electronic Materials and Devices"}],"tags":[],"updatedAt":"2021-09-12T14:51:01+00:00","versionOfRecord":[],"versionCreatedAt":"2021-02-23 20:10:55","video":"","vorDoi":"","vorDoiUrl":"","workflowStages":[]},"version":"v1","identity":"rs-216115","journalConfig":"researchsquare"},"__N_SSP":true},"page":"/article/[identity]/[[...version]]","query":{"redirect":"/article/rs-216115","identity":"rs-216115","version":["v1"]},"buildId":"FbvkV6FR0MCFSLy54lSbu","isFallback":false,"isExperimentalCompile":false,"dynamicIds":[84888],"gssp":true,"scriptLoader":[]}