KAWAMOTO, Yasuko

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

X-ray crystal spectrometer is mesurement for ion temperature in the plasma center of a large helical device (LHD) using Doppler broadening of a He-like resonance line of ArXVII, TiXXI, CrXXIII, or FeXXV.

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) spectroscopy diagnostics are applied to measure wavelength spectra including line emissions released from Ne ions ranging from low to high charge states simultaneously in a single disch…

Fast ion charge exchange spectroscopy (FIDA) with high time resolution

Measurement of the toroidal distribution of H-alpha. H-alpha line emissions passing through an interference filter are detected by photomultiplier, and the time resolution is 0.1ms.

Measurement of the toroidal distribution of H-alpha. H-alpha line emissions passing through an interference filter are detected by photomultiplier, and the time resolution is 0.1ms.

Measurement of the toroidal distribution of H-alpha. H-alpha line emissions passing through an interference filter are detected by photomultiplier, and the time resolution is 0.1ms.

Measurement of the toroidal distribution of H-alpha. H-alpha line emissions passing through an interference filter are detected by photomultiplier, and the time resolution is 0.1ms.

Measurement of the toroidal distribution of He-I. He-I line emissions passing through an interference filter are detected by photomultiplier, and the time resolution is 0.1ms.

Measurement of the toroidal distribution of He-I. He-I line emissions passing through an interference filter are detected by photomultiplier, and the time resolution is 0.1ms.

Measurement of the toroidal distribution of He-I. He-I line emissions passing through an interference filter are detected by photomultiplier, and the time resolution is 0.1ms.

Monitoring H/D influx ratio, which use visible spectrometer having f = 15 cm and 1800 lines/mm grating, the time resolution is 25 ms (exposure time is 15 ms) and the observation area is a single line-of-sight at 10-O.

Toroidal visible array to measure toroidal distribution of H-alpha and He-I, ratio of helium to hydrogen: H/(H+He) or D/(D+He), and particle recycling and edge tau_p. H-alpha and He-I line emissions are detected by photomultipliers passing …

Toroidal visible array to measure toroidal distribution of H-alpha and He-I, ratio of helium to hydrogen: H/(H+He) or D/(D+He), and particle recycling and edge tau_p. H-alpha and He-I line emissions are detected by photomultipliers passing …