SHIMIZU, Akihiro
ORCID: 0000-0003-3764-3184
· 3 papers in corpus
dataset
2025
Heavy Ion Beam Probe (HIBP) to measure electric potential, its fluctuation, density fluctuation, and their spatial profiles, which uses sputter-type negative ion source producing Au- and Cu- beams (<20 nA) with nominal acceleration voltage …
dataset
2024
Heavy Ion Beam Probe (HIBP) to measure electric potential, its fluctuation, density fluctuation, and their spatial profiles, which uses sputter-type negative ion source producing Au- and Cu- beams (<20 nA) with nominal acceleration voltage …
dataset
2024
Heavy Ion Beam Probe (HIBP) to measure electric potential, its fluctuation, density fluctuation, and their spatial profiles, which uses sputter-type negative ion source producing Au- and Cu- beams (<20 nA) with nominal acceleration voltage …