{"paper_id":"3d8cd29c-0dc1-4884-ac4b-7e4884965914","body_text":"Afterpulse and dark count simulator for single photon avalanche detector | Research Square window.SnipcartSettings = { analytics: { enabled: false } }; (function() { var accessVector = localStorage.getItem('access_vector') || ''; window.dataLayer = window.dataLayer || []; if (accessVector) { window.dataLayer.push({ user: { profile: { profileInfo: { snid: accessVector } } } }); } })(); (function(w,d,s,l,i){w[l]=w[l]||[];w[l].push({'gtm.start':new Date().getTime(),event:'gtm.js'});var f=d.getElementsByTagName(s)[0],j=d.createElement(s),dl=l!='dataLayer'?'&l='+l:'';j.async=true;j.src='https://www.googletagmanager.com/gtm.js?id='+i+dl;f.parentNode.insertBefore(j,f);})(window,document,'script','dataLayer','GTM-K279D39R'); Browse Preprints In Review Journals COVID-19 Preprints AJE Video Bytes Research Tools Research Promotion AJE Professional Editing AJE Rubriq About Preprint Platform In Review Editorial Policies Our Team Advisory Board Help Center Sign In Submit a Preprint Cite Share Download PDF Research Article Afterpulse and dark count simulator for single photon avalanche detector Mahdi Rahmanpour, Mahdi Khaje, Alireza Erfanian, MohammahHossein Fahimifar, and 1 more This is a preprint; it has not been peer reviewed by a journal. https://doi.org/ 10.21203/rs.3.rs-3175872/v1 This work is licensed under a CC BY 4.0 License Status: Posted Version 1 posted You are reading this latest preprint version Abstract Avalanche single photon detector detects the presence or absence of photons and their reception frequency. One of the most important challenges of using InGaAs semiconductor in single-photon detectors is detecting error pulses in two categories of dark counting and afterpulse counting. Dark counting is the revealing output pulses that are created in conditions of no photon reception. its leading cause is due to temperature effects on the carriers. Afterpulse is another undesirable factor that occurs due to the trapping of carriers after the avalanche failure event in the detector. The trapped carriers accelerate due to the electric field applied to the detector and create another avalanche breakdown called afterpulse. Due to the importance of the error resulting from dark and afterpulse counting in photon detection and the need to analyze, optimize and reduce its effects, it is necessary to simulate their behavior. In this article, a new method of simulating noise of SPADs is presented. In the proposed model, FPGA chip is used to generate error pulses. The proposed FPGA model is XC3S400 from Xilinx. By the VHDL hardware design code, the parameters effective in creating the dark pulse, and afterpulse are placed in their simulator equations. the results appear in the output as unwanted pulses next to the photon pulses. Single photon detector Afterpulse Dark count rate Simulator FPGA Full Text Additional Declarations Competing interest reported. Quantum single photon electronics photonics Cite Share Download PDF Status: Posted Version 1 posted You are reading this latest preprint version Research Square lets you share your work early, gain feedback from the community, and start making changes to your manuscript prior to peer review in a journal. As a division of Research Square Company, we’re committed to making research communication faster, fairer, and more useful. We do this by developing innovative software and high quality services for the global research community. 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Also discoverable on Platform About Our Team In Review Editorial Policies Advisory Board Help Center Resources Author Services Accessibility API Access RSS feed Manage Cookie Preferences © Research Square 2026 | ISSN 2693-5015 (online) Privacy Policy Terms of Service Do Not Sell My Personal Information {\"props\":{\"pageProps\":{\"initialData\":{\"identity\":\"rs-3175872\",\"acceptedTermsAndConditions\":true,\"allowDirectSubmit\":true,\"archivedVersions\":[],\"articleType\":\"Research Article\",\"associatedPublications\":[],\"authors\":[{\"id\":219107279,\"identity\":\"528e6168-0fd1-45dd-a007-16fbc83ec819\",\"order_by\":0,\"name\":\"Mahdi Rahmanpour\",\"email\":\"\",\"orcid\":\"\",\"institution\":\"Malek-Ashtar University of Technology\",\"correspondingAuthor\":false,\"prefix\":\"\",\"firstName\":\"Mahdi\",\"middleName\":\"\",\"lastName\":\"Rahmanpour\",\"suffix\":\"\"},{\"id\":219107282,\"identity\":\"83082a66-ba83-4e3c-aead-56aa790ffc9a\",\"order_by\":1,\"name\":\"Mahdi Khaje\",\"email\":\"\",\"orcid\":\"\",\"institution\":\"Malek-Ashtar University of Technology\",\"correspondingAuthor\":false,\"prefix\":\"\",\"firstName\":\"Mahdi\",\"middleName\":\"\",\"lastName\":\"Khaje\",\"suffix\":\"\"},{\"id\":219107285,\"identity\":\"4c54d980-9724-4316-b170-43a1cb619d7d\",\"order_by\":2,\"name\":\"Alireza Erfanian\",\"email\":\"data:image/png;base64,iVBORw0KGgoAAAANSUhEUgAAAZAAAAAyAQMAAABI0h/eAAAABlBMVEX///8AAABVwtN+AAAACXBIWXMAAA7EAAAOxAGVKw4bAAAA0UlEQVRIiWNgGAWjYFACxgcMDAYMDPwwPhthLcwGYC2SDQyMDSRoAQKDA1AtBAG/9GHGzwUFdnnG186YP2CosWPgkz6AX4tkXzKz9AyD5GKz2zmGDQzHkhnY+BLwazE4w39AmseAOXEbWAvbAQY2HgIOsz/DzPybx6A+cfNskJZ/RGgx4GFmA9pyOHGDNFALYxsRWiTOMLNZ8xgcT5xxO61wRmJfMg9BLfw9zMy3ef5UJ/bPTt7w4cM3Ozn5HgJaUEECAwMhO0bBKBgFo2AUEAMAj7I2D6M7hXgAAAAASUVORK5CYII=\",\"orcid\":\"\",\"institution\":\"Malek-Ashtar University of Technology\",\"correspondingAuthor\":true,\"prefix\":\"\",\"firstName\":\"Alireza\",\"middleName\":\"\",\"lastName\":\"Erfanian\",\"suffix\":\"\"},{\"id\":219107288,\"identity\":\"b873387f-4746-40bd-b5c9-43129d82e3b7\",\"order_by\":3,\"name\":\"MohammahHossein Fahimifar\",\"email\":\"\",\"orcid\":\"\",\"institution\":\"Malek-Ashtar University of Technology\",\"correspondingAuthor\":false,\"prefix\":\"\",\"firstName\":\"MohammahHossein\",\"middleName\":\"\",\"lastName\":\"Fahimifar\",\"suffix\":\"\"},{\"id\":219107290,\"identity\":\"e42fb2ac-dfa1-4dd6-9c6c-c4f19c09438a\",\"order_by\":4,\"name\":\"Ahmad Afifi\",\"email\":\"\",\"orcid\":\"\",\"institution\":\"Malek-Ashtar University of Technology\",\"correspondingAuthor\":false,\"prefix\":\"\",\"firstName\":\"Ahmad\",\"middleName\":\"\",\"lastName\":\"Afifi\",\"suffix\":\"\"}],\"badges\":[],\"createdAt\":\"2023-07-16 20:44:15\",\"currentVersionCode\":1,\"declarations\":\"\",\"doi\":\"10.21203/rs.3.rs-3175872/v1\",\"doiUrl\":\"https://doi.org/10.21203/rs.3.rs-3175872/v1\",\"draftVersion\":[],\"editorialEvents\":[],\"editorialNote\":\"\",\"failedWorkflow\":false,\"files\":[{\"id\":58762186,\"identity\":\"5b477547-0b45-4a7d-ba04-6eb796f5b16f\",\"added_by\":\"auto\",\"created_at\":\"2024-06-20 19:41:09\",\"extension\":\"pdf\",\"order_by\":1,\"title\":\"\",\"display\":\"\",\"copyAsset\":false,\"role\":\"manuscript-pdf\",\"size\":761668,\"visible\":true,\"origin\":\"\",\"legend\":\"\",\"description\":\"\",\"filename\":\"newpaperVer4.pdf\",\"url\":\"https://assets-eu.researchsquare.com/files/rs-3175872/v1_covered_c2ad7f41-75da-4087-bf0b-1c3d021d27ea.pdf\"}],\"financialInterests\":\"Competing interest reported. 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